X-ray photoelectron spectroscopy of organic thin films

Abraham Ulman, James F. Elman

Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

Original languageEnglish (US)
Title of host publicationCharacterization of organic thin films
EditorsA Ulman
Place of PublicationBoston
PublisherButterworth-Heinemann Press
StatePublished - 1995

Cite this

Ulman, A., & Elman, J. F. (1995). X-ray photoelectron spectroscopy of organic thin films. In A. Ulman (Ed.), Characterization of organic thin films Boston: Butterworth-Heinemann Press.

X-ray photoelectron spectroscopy of organic thin films. / Ulman, Abraham; Elman, James F.

Characterization of organic thin films. ed. / A Ulman. Boston : Butterworth-Heinemann Press, 1995.

Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

Ulman, A & Elman, JF 1995, X-ray photoelectron spectroscopy of organic thin films. in A Ulman (ed.), Characterization of organic thin films. Butterworth-Heinemann Press, Boston.
Ulman A, Elman JF. X-ray photoelectron spectroscopy of organic thin films. In Ulman A, editor, Characterization of organic thin films. Boston: Butterworth-Heinemann Press. 1995
Ulman, Abraham ; Elman, James F. / X-ray photoelectron spectroscopy of organic thin films. Characterization of organic thin films. editor / A Ulman. Boston : Butterworth-Heinemann Press, 1995.
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