Variability and Reliability Awareness in the Age of Dark Silicon

Florian Kriebel, Muhammad Shafique, Semeen Rehman, Jorg Henkel, Siddharth Garg

Research output: Contribution to journalArticle

Abstract

Ability to supply more transistors per chip is outpacing improvements in cooling and power delivery. The result is operation that selectively powers on or off subsets of transistors. This paper suggests innovate ways to take advantage of the consequent dark silicon to meet a pair of additional emerging challenges-reliability and tolerance of variability.

Original languageEnglish (US)
Article number7115064
Pages (from-to)59-67
Number of pages9
JournalIEEE Design and Test
Volume33
Issue number2
DOIs
StatePublished - Apr 1 2016

Fingerprint

Transistors
Silicon
Cooling

Keywords

  • Dark Silicon
  • Fault Tolerance
  • Heterogeneous Computing
  • Multi-Cores
  • Power Density
  • Process Variations
  • Reliability
  • Soft Errors

ASJC Scopus subject areas

  • Hardware and Architecture
  • Software
  • Electrical and Electronic Engineering

Cite this

Variability and Reliability Awareness in the Age of Dark Silicon. / Kriebel, Florian; Shafique, Muhammad; Rehman, Semeen; Henkel, Jorg; Garg, Siddharth.

In: IEEE Design and Test, Vol. 33, No. 2, 7115064, 01.04.2016, p. 59-67.

Research output: Contribution to journalArticle

Kriebel, F, Shafique, M, Rehman, S, Henkel, J & Garg, S 2016, 'Variability and Reliability Awareness in the Age of Dark Silicon', IEEE Design and Test, vol. 33, no. 2, 7115064, pp. 59-67. https://doi.org/10.1109/MDAT.2015.2439640
Kriebel, Florian ; Shafique, Muhammad ; Rehman, Semeen ; Henkel, Jorg ; Garg, Siddharth. / Variability and Reliability Awareness in the Age of Dark Silicon. In: IEEE Design and Test. 2016 ; Vol. 33, No. 2. pp. 59-67.
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