Unified 2-D X-alignment for improving the observability of response compactors

Ozgur Sinanoglu, Sobeeh Almukhaizim

Research output: Contribution to journalArticle

Abstract

Despite the advantages of performing response compaction in integrated-circuit testing, unknown response bits (x's) inevitably reflect into loss in test quality. The distribution of these x's within the captured response, which varies for each test pattern, directly impacts the number of scan cells observed through the response compactor. In this paper, we propose a unified 2-D x-alignment technique in order to judiciously manipulate the distribution of x's in the test response prior to its compaction. The controlled response manipulation is performed on a per pattern basis, in the form of scan chain delay and intra-slice rotate operations, and with the objective that x's are aligned within as few scan slices and chains as possible. Consequently, a larger number of scan cells are observed after compaction for any test pattern. In an effort to tackle the unified 2-D x-alignment problem and to achieve maximum overall observability, we first decipher the interaction between 1-D x-alignment operations, and formulate 1-D and 2-D x-alignment operations all as maximum satisfiability (MAX-SAT) problems; a weighted MAX-SAT formulation is necessitated in the 2-D case to identify the best possible 2-D x-alignment, which may differ from back to back application of the individual best possible 1-D alignments in two dimensions. The proposed technique is test set independent, leading to a generic, simple, and cost-effective hardware implementation. While we show in this paper that x-alignment improves horizontal and vertical compactors, covering a wide spectrum of compactors, it is expected to improve other types of compactors as well by manipulating the x-distribution properly.

Original languageEnglish (US)
Article number6046182
Pages (from-to)1744-1757
Number of pages14
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume30
Issue number11
DOIs
StatePublished - Nov 1 2011

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Observability
Compaction
Integrated circuit testing
Hardware
Costs

Keywords

  • Design for testability
  • satisfiability
  • scan-based test
  • test data compression
  • testing

ASJC Scopus subject areas

  • Software
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

Cite this

Unified 2-D X-alignment for improving the observability of response compactors. / Sinanoglu, Ozgur; Almukhaizim, Sobeeh.

In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 30, No. 11, 6046182, 01.11.2011, p. 1744-1757.

Research output: Contribution to journalArticle

@article{8fb3df2be87243c094def0710415ef6f,
title = "Unified 2-D X-alignment for improving the observability of response compactors",
abstract = "Despite the advantages of performing response compaction in integrated-circuit testing, unknown response bits (x's) inevitably reflect into loss in test quality. The distribution of these x's within the captured response, which varies for each test pattern, directly impacts the number of scan cells observed through the response compactor. In this paper, we propose a unified 2-D x-alignment technique in order to judiciously manipulate the distribution of x's in the test response prior to its compaction. The controlled response manipulation is performed on a per pattern basis, in the form of scan chain delay and intra-slice rotate operations, and with the objective that x's are aligned within as few scan slices and chains as possible. Consequently, a larger number of scan cells are observed after compaction for any test pattern. In an effort to tackle the unified 2-D x-alignment problem and to achieve maximum overall observability, we first decipher the interaction between 1-D x-alignment operations, and formulate 1-D and 2-D x-alignment operations all as maximum satisfiability (MAX-SAT) problems; a weighted MAX-SAT formulation is necessitated in the 2-D case to identify the best possible 2-D x-alignment, which may differ from back to back application of the individual best possible 1-D alignments in two dimensions. The proposed technique is test set independent, leading to a generic, simple, and cost-effective hardware implementation. While we show in this paper that x-alignment improves horizontal and vertical compactors, covering a wide spectrum of compactors, it is expected to improve other types of compactors as well by manipulating the x-distribution properly.",
keywords = "Design for testability, satisfiability, scan-based test, test data compression, testing",
author = "Ozgur Sinanoglu and Sobeeh Almukhaizim",
year = "2011",
month = "11",
day = "1",
doi = "10.1109/TCAD.2011.2160175",
language = "English (US)",
volume = "30",
pages = "1744--1757",
journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
issn = "0278-0070",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "11",

}

TY - JOUR

T1 - Unified 2-D X-alignment for improving the observability of response compactors

AU - Sinanoglu, Ozgur

AU - Almukhaizim, Sobeeh

PY - 2011/11/1

Y1 - 2011/11/1

N2 - Despite the advantages of performing response compaction in integrated-circuit testing, unknown response bits (x's) inevitably reflect into loss in test quality. The distribution of these x's within the captured response, which varies for each test pattern, directly impacts the number of scan cells observed through the response compactor. In this paper, we propose a unified 2-D x-alignment technique in order to judiciously manipulate the distribution of x's in the test response prior to its compaction. The controlled response manipulation is performed on a per pattern basis, in the form of scan chain delay and intra-slice rotate operations, and with the objective that x's are aligned within as few scan slices and chains as possible. Consequently, a larger number of scan cells are observed after compaction for any test pattern. In an effort to tackle the unified 2-D x-alignment problem and to achieve maximum overall observability, we first decipher the interaction between 1-D x-alignment operations, and formulate 1-D and 2-D x-alignment operations all as maximum satisfiability (MAX-SAT) problems; a weighted MAX-SAT formulation is necessitated in the 2-D case to identify the best possible 2-D x-alignment, which may differ from back to back application of the individual best possible 1-D alignments in two dimensions. The proposed technique is test set independent, leading to a generic, simple, and cost-effective hardware implementation. While we show in this paper that x-alignment improves horizontal and vertical compactors, covering a wide spectrum of compactors, it is expected to improve other types of compactors as well by manipulating the x-distribution properly.

AB - Despite the advantages of performing response compaction in integrated-circuit testing, unknown response bits (x's) inevitably reflect into loss in test quality. The distribution of these x's within the captured response, which varies for each test pattern, directly impacts the number of scan cells observed through the response compactor. In this paper, we propose a unified 2-D x-alignment technique in order to judiciously manipulate the distribution of x's in the test response prior to its compaction. The controlled response manipulation is performed on a per pattern basis, in the form of scan chain delay and intra-slice rotate operations, and with the objective that x's are aligned within as few scan slices and chains as possible. Consequently, a larger number of scan cells are observed after compaction for any test pattern. In an effort to tackle the unified 2-D x-alignment problem and to achieve maximum overall observability, we first decipher the interaction between 1-D x-alignment operations, and formulate 1-D and 2-D x-alignment operations all as maximum satisfiability (MAX-SAT) problems; a weighted MAX-SAT formulation is necessitated in the 2-D case to identify the best possible 2-D x-alignment, which may differ from back to back application of the individual best possible 1-D alignments in two dimensions. The proposed technique is test set independent, leading to a generic, simple, and cost-effective hardware implementation. While we show in this paper that x-alignment improves horizontal and vertical compactors, covering a wide spectrum of compactors, it is expected to improve other types of compactors as well by manipulating the x-distribution properly.

KW - Design for testability

KW - satisfiability

KW - scan-based test

KW - test data compression

KW - testing

UR - http://www.scopus.com/inward/record.url?scp=80054820668&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80054820668&partnerID=8YFLogxK

U2 - 10.1109/TCAD.2011.2160175

DO - 10.1109/TCAD.2011.2160175

M3 - Article

AN - SCOPUS:80054820668

VL - 30

SP - 1744

EP - 1757

JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

SN - 0278-0070

IS - 11

M1 - 6046182

ER -