### Abstract

Two methods are proposed for the accurate and convenient measurement of the dielectric constant of a microwave substrate. Both methods use the HP-8510 network analyzer system and a rigorous theoretical analysis of multilayer transmission lines. The methods can also be used for the measurement of the frequency dependence of the relative dielectric constant. Accuracy on the order of 1. 0% can be obtained. In both methods, the effective dielectric constant epsilon //e//f//f of a particular transmission line is the quantity that is actually measured (or inferred from measurement). The dielectric constant of the substrate epsilon //r is then determined by working backwards, using a computer program for the rigorous analysis of the specific transmission line structure. The value of epsilon //r input to the program is varied until the resulting epsilon //e//f//f agrees with the measured value. The corresponding value of epsilon //r is then the dielectric constant of the substrate. In both methods, the errors due to connector reactance/mismatch are canceled by measuring the differences in phase between two lines. Measurements on various substrates are presented.

Original language | English (US) |
---|---|

Pages (from-to) | 636-642 |

Number of pages | 7 |

Journal | IEEE Transactions on Microwave Theory and Techniques |

Volume | MTT-35 |

Issue number | 7 |

State | Published - Jul 1987 |

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### ASJC Scopus subject areas

- Electrical and Electronic Engineering

### Cite this

*IEEE Transactions on Microwave Theory and Techniques*,

*MTT-35*(7), 636-642.

**TWO METHODS FOR THE MEASUREMENT OF SUBSTRATE DIELECTRIC CONSTANT.** / Das, Nirod; Voda, Susanne M.; Pozar, David M.

Research output: Contribution to journal › Article

*IEEE Transactions on Microwave Theory and Techniques*, vol. MTT-35, no. 7, pp. 636-642.

}

TY - JOUR

T1 - TWO METHODS FOR THE MEASUREMENT OF SUBSTRATE DIELECTRIC CONSTANT.

AU - Das, Nirod

AU - Voda, Susanne M.

AU - Pozar, David M.

PY - 1987/7

Y1 - 1987/7

N2 - Two methods are proposed for the accurate and convenient measurement of the dielectric constant of a microwave substrate. Both methods use the HP-8510 network analyzer system and a rigorous theoretical analysis of multilayer transmission lines. The methods can also be used for the measurement of the frequency dependence of the relative dielectric constant. Accuracy on the order of 1. 0% can be obtained. In both methods, the effective dielectric constant epsilon //e//f//f of a particular transmission line is the quantity that is actually measured (or inferred from measurement). The dielectric constant of the substrate epsilon //r is then determined by working backwards, using a computer program for the rigorous analysis of the specific transmission line structure. The value of epsilon //r input to the program is varied until the resulting epsilon //e//f//f agrees with the measured value. The corresponding value of epsilon //r is then the dielectric constant of the substrate. In both methods, the errors due to connector reactance/mismatch are canceled by measuring the differences in phase between two lines. Measurements on various substrates are presented.

AB - Two methods are proposed for the accurate and convenient measurement of the dielectric constant of a microwave substrate. Both methods use the HP-8510 network analyzer system and a rigorous theoretical analysis of multilayer transmission lines. The methods can also be used for the measurement of the frequency dependence of the relative dielectric constant. Accuracy on the order of 1. 0% can be obtained. In both methods, the effective dielectric constant epsilon //e//f//f of a particular transmission line is the quantity that is actually measured (or inferred from measurement). The dielectric constant of the substrate epsilon //r is then determined by working backwards, using a computer program for the rigorous analysis of the specific transmission line structure. The value of epsilon //r input to the program is varied until the resulting epsilon //e//f//f agrees with the measured value. The corresponding value of epsilon //r is then the dielectric constant of the substrate. In both methods, the errors due to connector reactance/mismatch are canceled by measuring the differences in phase between two lines. Measurements on various substrates are presented.

UR - http://www.scopus.com/inward/record.url?scp=0023381833&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023381833&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0023381833

VL - MTT-35

SP - 636

EP - 642

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

SN - 0018-9480

IS - 7

ER -