Abstract
Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.
| Original language | English (US) |
|---|---|
| Article number | 5713301 |
| Pages (from-to) | 46-53 |
| Number of pages | 8 |
| Journal | Computer |
| Volume | 44 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2011 |
Keywords
- Nanoscale systems
- Reliability
ASJC Scopus subject areas
- Computer Science(all)
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Cite this
Rao, W., Yang, C., Karri, R., & Orailoglu, A. (2011). Toward future systems with nanoscale devices: Overcoming the reliability challenge. Computer, 44(2), 46-53. [5713301]. https://doi.org/10.1109/MC.2011.1