Toward future systems with nanoscale devices

Overcoming the reliability challenge

Wenjing Rao, Chengmo Yang, Ramesh Karri, Alex Orailoglu

Research output: Contribution to journal › Article

Abstract

Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.

Original languageEnglish (US)
Article number5713301
Pages (from-to)46-53
Number of pages8
JournalComputer
Volume44
Issue number2
DOIs
StatePublished - Feb 2011

Fingerprint

Nanoelectronics
Hinges

Keywords

  • Nanoscale systems
  • Reliability

ASJC Scopus subject areas

  • Computer Science(all)

Cite this

Toward future systems with nanoscale devices : Overcoming the reliability challenge. / Rao, Wenjing; Yang, Chengmo; Karri, Ramesh; Orailoglu, Alex.

In: Computer, Vol. 44, No. 2, 5713301, 02.2011, p. 46-53.

Research output: Contribution to journal › Article

Rao, W, Yang, C, Karri, R & Orailoglu, A 2011, 'Toward future systems with nanoscale devices: Overcoming the reliability challenge', Computer, vol. 44, no. 2, 5713301, pp. 46-53. https://doi.org/10.1109/MC.2011.1
Rao W, Yang C, Karri R, Orailoglu A. Toward future systems with nanoscale devices: Overcoming the reliability challenge. Computer. 2011 Feb;44(2):46-53. 5713301. https://doi.org/10.1109/MC.2011.1
Rao, Wenjing ; Yang, Chengmo ; Karri, Ramesh ; Orailoglu, Alex. / Toward future systems with nanoscale devices : Overcoming the reliability challenge. In: Computer. 2011 ; Vol. 44, No. 2. pp. 46-53.
@article{433cd6ea9595450d85c971993f27fde8,
title = "Toward future systems with nanoscale devices: Overcoming the reliability challenge",
abstract = "Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.",
keywords = "Nanoscale systems, Reliability",
author = "Wenjing Rao and Chengmo Yang and Ramesh Karri and Alex Orailoglu",
year = "2011",
month = "2",
doi = "10.1109/MC.2011.1",
language = "English (US)",
volume = "44",
pages = "46--53",
journal = "ACM SIGPLAN/SIGSOFT Workshop on Program Analysis for Software Tools and Engineering",
issn = "0018-9162",
publisher = "IEEE Computer Society",
number = "2",

}

TY - JOUR

T1 - Toward future systems with nanoscale devices

T2 - Overcoming the reliability challenge

AU - Rao, Wenjing

AU - Yang, Chengmo

AU - Karri, Ramesh

AU - Orailoglu, Alex

PY - 2011/2

Y1 - 2011/2

N2 - Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.

AB - Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.

KW - Nanoscale systems

KW - Reliability

UR - http://www.scopus.com/inward/record.url?scp=79951898918&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79951898918&partnerID=8YFLogxK

U2 - 10.1109/MC.2011.1

DO - 10.1109/MC.2011.1

M3 - Article

VL - 44

SP - 46

EP - 53

JO - ACM SIGPLAN/SIGSOFT Workshop on Program Analysis for Software Tools and Engineering

JF - ACM SIGPLAN/SIGSOFT Workshop on Program Analysis for Software Tools and Engineering

SN - 0018-9162

IS - 2

M1 - 5713301

ER -

Access to Document