Toward future systems with nanoscale devices: Overcoming the reliability challenge

Wenjing Rao, Chengmo Yang, Ramesh Karri, Alex Orailoglu

Research output: Contribution to journal › Article

Abstract

Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.

Original languageEnglish (US)
Article number5713301
Pages (from-to)46-53
Number of pages8
JournalComputer
Volume44
Issue number2
DOIs
StatePublished - Feb 2011

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Nanoelectronics
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Keywords

  • Nanoscale systems
  • Reliability

ASJC Scopus subject areas

  • Computer Science(all)

Cite this

Toward future systems with nanoscale devices : Overcoming the reliability challenge. / Rao, Wenjing; Yang, Chengmo; Karri, Ramesh; Orailoglu, Alex.

In: Computer, Vol. 44, No. 2, 5713301, 02.2011, p. 46-53.

Research output: Contribution to journal › Article

Rao, W, Yang, C, Karri, R & Orailoglu, A 2011, 'Toward future systems with nanoscale devices: Overcoming the reliability challenge', Computer, vol. 44, no. 2, 5713301, pp. 46-53. https://doi.org/10.1109/MC.2011.1
Rao W, Yang C, Karri R, Orailoglu A. Toward future systems with nanoscale devices: Overcoming the reliability challenge. Computer. 2011 Feb;44(2):46-53. 5713301. https://doi.org/10.1109/MC.2011.1
Rao, Wenjing ; Yang, Chengmo ; Karri, Ramesh ; Orailoglu, Alex. / Toward future systems with nanoscale devices : Overcoming the reliability challenge. In: Computer. 2011 ; Vol. 44, No. 2. pp. 46-53.
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