Abstract
Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.
Original language | English (US) |
---|---|
Article number | 5713301 |
Pages (from-to) | 46-53 |
Number of pages | 8 |
Journal | Computer |
Volume | 44 |
Issue number | 2 |
DOIs | |
State | Published - Feb 2011 |
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Keywords
- Nanoscale systems
- Reliability
ASJC Scopus subject areas
- Computer Science(all)
Cite this
Toward future systems with nanoscale devices : Overcoming the reliability challenge. / Rao, Wenjing; Yang, Chengmo; Karri, Ramesh; Orailoglu, Alex.
In: Computer, Vol. 44, No. 2, 5713301, 02.2011, p. 46-53.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Toward future systems with nanoscale devices
T2 - Overcoming the reliability challenge
AU - Rao, Wenjing
AU - Yang, Chengmo
AU - Karri, Ramesh
AU - Orailoglu, Alex
PY - 2011/2
Y1 - 2011/2
N2 - Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.
AB - Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.
KW - Nanoscale systems
KW - Reliability
UR - http://www.scopus.com/inward/record.url?scp=79951898918&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79951898918&partnerID=8YFLogxK
U2 - 10.1109/MC.2011.1
DO - 10.1109/MC.2011.1
M3 - Article
AN - SCOPUS:79951898918
VL - 44
SP - 46
EP - 53
JO - ACM SIGPLAN/SIGSOFT Workshop on Program Analysis for Software Tools and Engineering
JF - ACM SIGPLAN/SIGSOFT Workshop on Program Analysis for Software Tools and Engineering
SN - 0018-9162
IS - 2
M1 - 5713301
ER -