Toggle-masking scheme for x-filtering

Abishek Ramdas, Ozgur Sinanoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

High quality screening of chips may require aggressive solutions such as faster-than-at-speed testing, which may generate responses with high density of unknown x's. Recently, we proposed a toggle-masking approach capable of masking all the unknown x's and minimizing the over-masked known bits for clustered distribution of unknown bits. In this work, we utilize our toggle-masking framework as a foundation, and transform this solution into an x-filter that allows a certain number/distribution of x's to pass, in order to further improve the observability levels. Naturally, the modified toggle-masking scheme is to be paired with another technique, such as an x-canceling MISR, which is capable of canceling the x's in the signature via post-processing operations. We propose different flavors of the proposed x-filter to be utilized with different versions of x-canceling MISR, which may suffer from test time increase and/or observability loss with high x-density responses. By proposing an x-filter that can adjust the number/distribution of x in-flow into the MISR, a perfect control over test time and observability is delivered, offering a wide spectrum of tradeoff solutions for the designers.

Original languageEnglish (US)
Title of host publicationProceedings - 2012 17th IEEE European Test Symposium, ETS 2012
DOIs
StatePublished - Aug 13 2012
Event2012 17th IEEE European Test Symposium, ETS 2012 - Annecy, France
Duration: May 28 2012Jun 1 2012

Publication series

NameProceedings - 2012 17th IEEE European Test Symposium, ETS 2012

Other

Other2012 17th IEEE European Test Symposium, ETS 2012
CountryFrance
CityAnnecy
Period5/28/126/1/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Toggle-masking scheme for x-filtering'. Together they form a unique fingerprint.

  • Cite this

    Ramdas, A., & Sinanoglu, O. (2012). Toggle-masking scheme for x-filtering. In Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012 [6233024] (Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012). https://doi.org/10.1109/ETS.2012.6233024