Toggle-based masking scheme for clustered unknown response bits

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Masking schemes typically suffer from over-masking of bits that may possess fault effect information, degrading test quality levels. Unknown response bits (x's) exhibit a clustered distribution in responses due to structural proximity of x sources. In this work, we propose a toggle-based masking scheme that is capable of delivering very high observability levels in the case of clustered x distributions. The proposed scheme assigns a single-bit state to each chain, dictating whether the chain will be masked or observed. Clustered distribution of x's enables an infrequent switching of state information, minimizing the amount of mask data that selectively toggles the state of chains. Thus, only a few mask channels are needed to control the proposed masking hardware, enabling the blocking of all x's while over-masking a small number of non-x bits. Capability to mask all x's enables the use of a MISR in conjunction, and thus eliminates the need for any scan-out channels, translating into enhanced parallelism in multi-site testing. Results on industrial test cases show that the proposed masking scheme is capable of minimizing or even eliminating over-masking, delivering near-optimal test quality levels.

Original languageEnglish (US)
Title of host publicationProceedings - 16th IEEE European Test Symposium, ETS 2011
Pages105-110
Number of pages6
DOIs
StatePublished - Aug 29 2011
Event16th IEEE European Test Symposium, ETS 2011 - Trondheim, Norway
Duration: May 23 2011May 27 2011

Publication series

NameProceedings - 16th IEEE European Test Symposium, ETS 2011

Other

Other16th IEEE European Test Symposium, ETS 2011
CountryNorway
CityTrondheim
Period5/23/115/27/11

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Sinanoglu, O. (2011). Toggle-based masking scheme for clustered unknown response bits. In Proceedings - 16th IEEE European Test Symposium, ETS 2011 (pp. 105-110). [5957931] (Proceedings - 16th IEEE European Test Symposium, ETS 2011). https://doi.org/10.1109/ETS.2011.57