Tip size effects on atomic force microscopy nanoindentation of a gold single crystal

Marcel Lucas, Ken Gall, Elisa Riedo

Research output: Contribution to journalArticle

Abstract

The effect of tip radius on atomic force microscopy (AFM) nanoindentation is investigated through indentation on the (111) face of a gold single crystal. The hardness is derived using two different methods: by measuring directly the projected area of the residual indent with AFM images and by measuring the cross-sectional area of the indenter before and after each nanoindentation test. The hardness values obtained from the cross-sectional area of the indenter are comparable with those obtained from images of the residual indent scanned with a sharp tip. Two AFM tips of average radii of 70±12 and 112±26 nm are used to indent the sample to various depths ranging from 4 to 50 nm. For depths above 30 nm, hardness values remain constant around 500 MPa for both indenters. For depths below 30 nm, the hardness increases as the indent depth decreases for the sharp and blunt indenters, and the indent depth dependence is observed over a wider depth range for the sharp indenter. For depths below 30 nm, the hardness values obtained with the sharp indenter are also consistently higher than those obtained with the blunt indenter. The results confirm a size scale effect during nanometer scale indentation for both varying penetration depth and tip radius, both of which influence the volume of material sampled during deformation.

Original languageEnglish (US)
Article number113515
JournalJournal of Applied Physics
Volume104
Issue number11
DOIs
StatePublished - Dec 1 2008

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nanoindentation
atomic force microscopy
gold
single crystals
hardness
indentation
radii
scale effect
penetration

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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Tip size effects on atomic force microscopy nanoindentation of a gold single crystal. / Lucas, Marcel; Gall, Ken; Riedo, Elisa.

In: Journal of Applied Physics, Vol. 104, No. 11, 113515, 01.12.2008.

Research output: Contribution to journalArticle

@article{de7715a787db4c6fa5de8d29092cca75,
title = "Tip size effects on atomic force microscopy nanoindentation of a gold single crystal",
abstract = "The effect of tip radius on atomic force microscopy (AFM) nanoindentation is investigated through indentation on the (111) face of a gold single crystal. The hardness is derived using two different methods: by measuring directly the projected area of the residual indent with AFM images and by measuring the cross-sectional area of the indenter before and after each nanoindentation test. The hardness values obtained from the cross-sectional area of the indenter are comparable with those obtained from images of the residual indent scanned with a sharp tip. Two AFM tips of average radii of 70±12 and 112±26 nm are used to indent the sample to various depths ranging from 4 to 50 nm. For depths above 30 nm, hardness values remain constant around 500 MPa for both indenters. For depths below 30 nm, the hardness increases as the indent depth decreases for the sharp and blunt indenters, and the indent depth dependence is observed over a wider depth range for the sharp indenter. For depths below 30 nm, the hardness values obtained with the sharp indenter are also consistently higher than those obtained with the blunt indenter. The results confirm a size scale effect during nanometer scale indentation for both varying penetration depth and tip radius, both of which influence the volume of material sampled during deformation.",
author = "Marcel Lucas and Ken Gall and Elisa Riedo",
year = "2008",
month = "12",
day = "1",
doi = "10.1063/1.3039511",
language = "English (US)",
volume = "104",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "11",

}

TY - JOUR

T1 - Tip size effects on atomic force microscopy nanoindentation of a gold single crystal

AU - Lucas, Marcel

AU - Gall, Ken

AU - Riedo, Elisa

PY - 2008/12/1

Y1 - 2008/12/1

N2 - The effect of tip radius on atomic force microscopy (AFM) nanoindentation is investigated through indentation on the (111) face of a gold single crystal. The hardness is derived using two different methods: by measuring directly the projected area of the residual indent with AFM images and by measuring the cross-sectional area of the indenter before and after each nanoindentation test. The hardness values obtained from the cross-sectional area of the indenter are comparable with those obtained from images of the residual indent scanned with a sharp tip. Two AFM tips of average radii of 70±12 and 112±26 nm are used to indent the sample to various depths ranging from 4 to 50 nm. For depths above 30 nm, hardness values remain constant around 500 MPa for both indenters. For depths below 30 nm, the hardness increases as the indent depth decreases for the sharp and blunt indenters, and the indent depth dependence is observed over a wider depth range for the sharp indenter. For depths below 30 nm, the hardness values obtained with the sharp indenter are also consistently higher than those obtained with the blunt indenter. The results confirm a size scale effect during nanometer scale indentation for both varying penetration depth and tip radius, both of which influence the volume of material sampled during deformation.

AB - The effect of tip radius on atomic force microscopy (AFM) nanoindentation is investigated through indentation on the (111) face of a gold single crystal. The hardness is derived using two different methods: by measuring directly the projected area of the residual indent with AFM images and by measuring the cross-sectional area of the indenter before and after each nanoindentation test. The hardness values obtained from the cross-sectional area of the indenter are comparable with those obtained from images of the residual indent scanned with a sharp tip. Two AFM tips of average radii of 70±12 and 112±26 nm are used to indent the sample to various depths ranging from 4 to 50 nm. For depths above 30 nm, hardness values remain constant around 500 MPa for both indenters. For depths below 30 nm, the hardness increases as the indent depth decreases for the sharp and blunt indenters, and the indent depth dependence is observed over a wider depth range for the sharp indenter. For depths below 30 nm, the hardness values obtained with the sharp indenter are also consistently higher than those obtained with the blunt indenter. The results confirm a size scale effect during nanometer scale indentation for both varying penetration depth and tip radius, both of which influence the volume of material sampled during deformation.

UR - http://www.scopus.com/inward/record.url?scp=58149216252&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=58149216252&partnerID=8YFLogxK

U2 - 10.1063/1.3039511

DO - 10.1063/1.3039511

M3 - Article

VL - 104

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 11

M1 - 113515

ER -