Thermal conductivity of thin metallic films by electron transport

Sunil Kumar, George C. Vradis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This study examines the effect of transverse thickness on the in-plane thermal conductivity of single crystal, defect-free, thin metallic films. The imposed temperature gradient is along the film and the transport of thermal energy is predominantly due to electron motion. The small size necessitates an evaluation of the Boltzmann equation of electron transport along with appropriate electron scattering boundary conditions. Simple expressions for the reduction of conductivity due to increased dominance of boundary scattering are presented and the results are compared with other simplified approaches and experimental data from the literature.

Original languageEnglish (US)
Title of host publicationHeat Transfer on the Microscale
PublisherPubl by ASME
Pages55-62
Number of pages8
Volume200
ISBN (Print)0791809269
StatePublished - 1992
Event28th National Heat Transfer Conference and Exhibition - San Diego, CA, USA
Duration: Aug 9 1992Aug 12 1992

Other

Other28th National Heat Transfer Conference and Exhibition
CitySan Diego, CA, USA
Period8/9/928/12/92

Fingerprint

Metallic films
Electron scattering
Boltzmann equation
Crystal defects
Thermal energy
Thermal gradients
Thermal conductivity
Boundary conditions
Single crystals
Scattering
Thin films
Electrons
Electron Transport

ASJC Scopus subject areas

  • Fluid Flow and Transfer Processes
  • Mechanical Engineering

Cite this

Kumar, S., & Vradis, G. C. (1992). Thermal conductivity of thin metallic films by electron transport. In Heat Transfer on the Microscale (Vol. 200, pp. 55-62). Publ by ASME.

Thermal conductivity of thin metallic films by electron transport. / Kumar, Sunil; Vradis, George C.

Heat Transfer on the Microscale. Vol. 200 Publ by ASME, 1992. p. 55-62.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kumar, S & Vradis, GC 1992, Thermal conductivity of thin metallic films by electron transport. in Heat Transfer on the Microscale. vol. 200, Publ by ASME, pp. 55-62, 28th National Heat Transfer Conference and Exhibition, San Diego, CA, USA, 8/9/92.
Kumar S, Vradis GC. Thermal conductivity of thin metallic films by electron transport. In Heat Transfer on the Microscale. Vol. 200. Publ by ASME. 1992. p. 55-62
Kumar, Sunil ; Vradis, George C. / Thermal conductivity of thin metallic films by electron transport. Heat Transfer on the Microscale. Vol. 200 Publ by ASME, 1992. pp. 55-62
@inproceedings{0d2e8854e8514b61be64d3bb00dd727e,
title = "Thermal conductivity of thin metallic films by electron transport",
abstract = "This study examines the effect of transverse thickness on the in-plane thermal conductivity of single crystal, defect-free, thin metallic films. The imposed temperature gradient is along the film and the transport of thermal energy is predominantly due to electron motion. The small size necessitates an evaluation of the Boltzmann equation of electron transport along with appropriate electron scattering boundary conditions. Simple expressions for the reduction of conductivity due to increased dominance of boundary scattering are presented and the results are compared with other simplified approaches and experimental data from the literature.",
author = "Sunil Kumar and Vradis, {George C.}",
year = "1992",
language = "English (US)",
isbn = "0791809269",
volume = "200",
pages = "55--62",
booktitle = "Heat Transfer on the Microscale",
publisher = "Publ by ASME",

}

TY - GEN

T1 - Thermal conductivity of thin metallic films by electron transport

AU - Kumar, Sunil

AU - Vradis, George C.

PY - 1992

Y1 - 1992

N2 - This study examines the effect of transverse thickness on the in-plane thermal conductivity of single crystal, defect-free, thin metallic films. The imposed temperature gradient is along the film and the transport of thermal energy is predominantly due to electron motion. The small size necessitates an evaluation of the Boltzmann equation of electron transport along with appropriate electron scattering boundary conditions. Simple expressions for the reduction of conductivity due to increased dominance of boundary scattering are presented and the results are compared with other simplified approaches and experimental data from the literature.

AB - This study examines the effect of transverse thickness on the in-plane thermal conductivity of single crystal, defect-free, thin metallic films. The imposed temperature gradient is along the film and the transport of thermal energy is predominantly due to electron motion. The small size necessitates an evaluation of the Boltzmann equation of electron transport along with appropriate electron scattering boundary conditions. Simple expressions for the reduction of conductivity due to increased dominance of boundary scattering are presented and the results are compared with other simplified approaches and experimental data from the literature.

UR - http://www.scopus.com/inward/record.url?scp=0027091889&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027091889&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0027091889

SN - 0791809269

VL - 200

SP - 55

EP - 62

BT - Heat Transfer on the Microscale

PB - Publ by ASME

ER -