Thermal conduction by electrons along thin films. Effects of thickness according to Boltzmann transport theory

Sunil Kumar, George C. Vradis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This study examines the effect of transverse thickness on the thermal conductivity of thin metallic films. The imposed temperature gradient is along the film and the transport of thermal energy is predominantly due to electron motion. The small size permits an evaluation of the Boltzmann equation of electron transport along with appropriate electron scattering boundary conditions. Simple expressions for the reduction of conductivity due to increased dominance of boundary scattering are presented and the results are compared with experimental data from the literature.

Original languageEnglish (US)
Title of host publicationMicromechanical Sensors, Actuators, and Systems
PublisherPubl by ASME
Pages89-101
Number of pages13
ISBN (Print)0791808637
StatePublished - Dec 1 1991
EventWinter Annual Meeting of the American Society of Mechanical Engineers - Atlanta, GA, USA
Duration: Dec 1 1991Dec 6 1991

Publication series

NameAmerican Society of Mechanical Engineers, Dynamic Systems and Control Division (Publication) DSC
Volume32

Other

OtherWinter Annual Meeting of the American Society of Mechanical Engineers
CityAtlanta, GA, USA
Period12/1/9112/6/91

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ASJC Scopus subject areas

  • Software
  • Mechanical Engineering

Cite this

Kumar, S., & Vradis, G. C. (1991). Thermal conduction by electrons along thin films. Effects of thickness according to Boltzmann transport theory. In Micromechanical Sensors, Actuators, and Systems (pp. 89-101). (American Society of Mechanical Engineers, Dynamic Systems and Control Division (Publication) DSC; Vol. 32). Publ by ASME.