The Use of Atomic Force Microscopy in Membrane Characterization

Nidal Hilal, D. Johnson

    Research output: Chapter in Book/Report/Conference proceedingChapter

    Abstract

    Atomic force microscopy (AFM) has been shown to be an excellent asset to understand engineering processes. This chapter describes the application of AFM to study membrane separation processes and characterization of membrane surfaces, including the surface topography, pore size, and pore-size distribution, in addition to the basic principles of operation of AFM. It has also been used to study surface electrical properties by the direct quantification of the forces of interaction between colloidal particles, cells, and membrane surfaces in both air and liquid environments. In addition to this, the technique has been used to study the adhesive forces (fouling) between colloidal particles and membrane surfaces under different conditions. The chapter explains the use of this technique for the development of biofouling-resistant membranes. This technique is potentially very valuable in the development of new process engineering surfaces and the modification of existing surfaces for specific applications.

    Original languageEnglish (US)
    Title of host publicationBasic Aspects of Membrane Science and Engineering
    PublisherElsevier Inc.
    Pages337-354
    Number of pages18
    Volume1
    ISBN (Electronic)9780080932507
    ISBN (Print)9780444532046
    DOIs
    StatePublished - Jul 9 2010

    Fingerprint

    Atomic force microscopy
    Membranes
    Pore size
    Biofouling
    Process engineering
    Surface topography
    Fouling
    Adhesives
    Electric properties
    Liquids
    Air

    Keywords

    • Atomic force microscopy
    • Colloid probe
    • Filtration membrane
    • Force measurements
    • Membrane characterization

    ASJC Scopus subject areas

    • Engineering(all)
    • Materials Science(all)

    Cite this

    Hilal, N., & Johnson, D. (2010). The Use of Atomic Force Microscopy in Membrane Characterization. In Basic Aspects of Membrane Science and Engineering (Vol. 1, pp. 337-354). Elsevier Inc.. https://doi.org/10.1016/B978-0-08-093250-7.00025-6

    The Use of Atomic Force Microscopy in Membrane Characterization. / Hilal, Nidal; Johnson, D.

    Basic Aspects of Membrane Science and Engineering. Vol. 1 Elsevier Inc., 2010. p. 337-354.

    Research output: Chapter in Book/Report/Conference proceedingChapter

    Hilal, N & Johnson, D 2010, The Use of Atomic Force Microscopy in Membrane Characterization. in Basic Aspects of Membrane Science and Engineering. vol. 1, Elsevier Inc., pp. 337-354. https://doi.org/10.1016/B978-0-08-093250-7.00025-6
    Hilal N, Johnson D. The Use of Atomic Force Microscopy in Membrane Characterization. In Basic Aspects of Membrane Science and Engineering. Vol. 1. Elsevier Inc. 2010. p. 337-354 https://doi.org/10.1016/B978-0-08-093250-7.00025-6
    Hilal, Nidal ; Johnson, D. / The Use of Atomic Force Microscopy in Membrane Characterization. Basic Aspects of Membrane Science and Engineering. Vol. 1 Elsevier Inc., 2010. pp. 337-354
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