Abstract
Test of integrated circuits (ICs) is essential to ensure their quality; the test is meant to prevent defective and out-of-spec ICs from entering into the supply chain. The test is conducted by comparing the observed IC output with the expected test responses for a set of test patterns; the test patterns are generated using automatic test pattern generation algorithms. Existing test-pattern generation algorithms aim to achieve higher fault coverage at lower test costs. In an attempt to reduce the size of test data, these algorithms reveal the maximum information about the internal circuit structure. This is realized through sensitizing the internal nets to the outputs as much as possible, unintentionally leaking the secrets embedded in the circuit as well. In this paper, we present HackTest, an attack that extracts secret information generated in the test data, even if the test data do not explicitly contain the secret. HackTest can break the existing intellectual property protection techniques, such as camouflaging, within 2 min for our benchmarks using only the camouflaged layout and the test data. HackTest applies to all existing camouflaged gate-selection techniques and is successful even in the presence of the state-of-The-Art test infrastructure, i.e., test data compression circuits. Our attack necessitates that the IC test data generation algorithms can be reinforced with security.
| Original language | English (US) |
|---|---|
| Article number | 7937844 |
| Pages (from-to) | 2668-2682 |
| Number of pages | 15 |
| Journal | IEEE Transactions on Information Forensics and Security |
| Volume | 12 |
| Issue number | 11 |
| DOIs | |
| State | Published - Nov 1 2017 |
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Keywords
- hardware security
- IC camouflaging
- IP piracy
- reverse engineering
- VLSI testing
ASJC Scopus subject areas
- Safety, Risk, Reliability and Quality
- Computer Networks and Communications
Cite this
Testing the Trustworthiness of IC Testing : An Oracle-Less Attack on IC Camouflaging. / Yasin, Muhammad; Sinanoglu, Ozgur; Rajendran, Jeyavijayan.
In: IEEE Transactions on Information Forensics and Security, Vol. 12, No. 11, 7937844, 01.11.2017, p. 2668-2682.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Testing the Trustworthiness of IC Testing
T2 - An Oracle-Less Attack on IC Camouflaging
AU - Yasin, Muhammad
AU - Sinanoglu, Ozgur
AU - Rajendran, Jeyavijayan
PY - 2017/11/1
Y1 - 2017/11/1
N2 - Test of integrated circuits (ICs) is essential to ensure their quality; the test is meant to prevent defective and out-of-spec ICs from entering into the supply chain. The test is conducted by comparing the observed IC output with the expected test responses for a set of test patterns; the test patterns are generated using automatic test pattern generation algorithms. Existing test-pattern generation algorithms aim to achieve higher fault coverage at lower test costs. In an attempt to reduce the size of test data, these algorithms reveal the maximum information about the internal circuit structure. This is realized through sensitizing the internal nets to the outputs as much as possible, unintentionally leaking the secrets embedded in the circuit as well. In this paper, we present HackTest, an attack that extracts secret information generated in the test data, even if the test data do not explicitly contain the secret. HackTest can break the existing intellectual property protection techniques, such as camouflaging, within 2 min for our benchmarks using only the camouflaged layout and the test data. HackTest applies to all existing camouflaged gate-selection techniques and is successful even in the presence of the state-of-The-Art test infrastructure, i.e., test data compression circuits. Our attack necessitates that the IC test data generation algorithms can be reinforced with security.
AB - Test of integrated circuits (ICs) is essential to ensure their quality; the test is meant to prevent defective and out-of-spec ICs from entering into the supply chain. The test is conducted by comparing the observed IC output with the expected test responses for a set of test patterns; the test patterns are generated using automatic test pattern generation algorithms. Existing test-pattern generation algorithms aim to achieve higher fault coverage at lower test costs. In an attempt to reduce the size of test data, these algorithms reveal the maximum information about the internal circuit structure. This is realized through sensitizing the internal nets to the outputs as much as possible, unintentionally leaking the secrets embedded in the circuit as well. In this paper, we present HackTest, an attack that extracts secret information generated in the test data, even if the test data do not explicitly contain the secret. HackTest can break the existing intellectual property protection techniques, such as camouflaging, within 2 min for our benchmarks using only the camouflaged layout and the test data. HackTest applies to all existing camouflaged gate-selection techniques and is successful even in the presence of the state-of-The-Art test infrastructure, i.e., test data compression circuits. Our attack necessitates that the IC test data generation algorithms can be reinforced with security.
KW - hardware security
KW - IC camouflaging
KW - IP piracy
KW - reverse engineering
KW - VLSI testing
UR - http://www.scopus.com/inward/record.url?scp=85029423877&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85029423877&partnerID=8YFLogxK
U2 - 10.1109/TIFS.2017.2710954
DO - 10.1109/TIFS.2017.2710954
M3 - Article
AN - SCOPUS:85029423877
VL - 12
SP - 2668
EP - 2682
JO - IEEE Transactions on Information Forensics and Security
JF - IEEE Transactions on Information Forensics and Security
SN - 1556-6013
IS - 11
M1 - 7937844
ER -