Test data manipulation techniques for energy-frugal, rapid scan test

O. Sinanoglu, A. Orailoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Scan-based testing methodologies remedy the testability problem of sequential circuits; yet they suffer from prolonged test time and excessive test power due to numerous shift operations. The significant correlation among test stimuli along with the high density of unspecified bits in test data enables the utilization of the existing test stimulus in the scan chain as the seed for the generation of the subsequent test stimulus, thus reducing both test time and test data volume. The proposed scan-based test scheme accesses only a subset of scan cells for loading the subsequent test stimulus while freezing the remaining scan cells with the preceding test stimulus, thus decreasing scan chain transitions during shift operations. The proposed scan architecture is coupled with test data manipulation techniques which include test stimuli ordering and partitioning algorithms, boosting test time reductions. The experimental results confirm the significant reductions in test application time, test data volume and test power achieved by the proposed scan-based testing methodology.

Original languageEnglish (US)
Title of host publicationProceedings - 12th Asian Test Symposium, ATS 2003
PublisherIEEE Computer Society
Pages202-207
Number of pages6
ISBN (Electronic)0769519512
DOIs
StatePublished - Jan 1 2003
Event12th Asian Test Symposium, ATS 2003 - Xi'an, China
Duration: Nov 16 2003Nov 19 2003

Publication series

NameProceedings of the Asian Test Symposium
Volume2003-January
ISSN (Print)1081-7735

Other

Other12th Asian Test Symposium, ATS 2003
CountryChina
CityXi'an
Period11/16/0311/19/03

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Sinanoglu, O., & Orailoglu, A. (2003). Test data manipulation techniques for energy-frugal, rapid scan test. In Proceedings - 12th Asian Test Symposium, ATS 2003 (pp. 202-207). [1250810] (Proceedings of the Asian Test Symposium; Vol. 2003-January). IEEE Computer Society. https://doi.org/10.1109/ATS.2003.1250810