Synergistic timing speculation for multi-threaded programs

Atif Yasin, Jeff Jun Zhang, Hu Chen, Siddharth Garg, Sanghamitra Roy, Koushik Chakraborty

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we address the problem of timing speculation for multi-threaded workloads executing on a multi-core processor. Our approach is based on a new observation - - heterogeneity in path sensitization delays across different threads in multi-threaded programs. Leveraging this heterogeneity, we propose Synergistic Timing Speculation (SynTS) to jointly optimize the energy and execution time of multithreaded applications. In particular, SynTS uses a sampling based online error probability estimation technique, coupled with a polynomial time algorithm, to optimally determine the voltage, frequency and the amount of timing speculation for each thread. Our experimental evaluations, based on detailed cross-layer simulations, demonstrate that SynTS reduces energy delay product by up to 21%, compared to existing timing speculation schemes.

Original languageEnglish (US)
Title of host publicationProceedings of the 53rd Annual Design Automation Conference, DAC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-6
Number of pages6
Volume05-09-June-2016
ISBN (Electronic)9781450342360
DOIs
Publication statusPublished - Jun 5 2016
Event53rd Annual ACM IEEE Design Automation Conference, DAC 2016 - Austin, United States
Duration: Jun 5 2016Jun 9 2016

Other

Other53rd Annual ACM IEEE Design Automation Conference, DAC 2016
CountryUnited States
CityAustin
Period6/5/166/9/16

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ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation

Cite this

Yasin, A., Zhang, J. J., Chen, H., Garg, S., Roy, S., & Chakraborty, K. (2016). Synergistic timing speculation for multi-threaded programs. In Proceedings of the 53rd Annual Design Automation Conference, DAC 2016 (Vol. 05-09-June-2016, pp. 1-6). [a51] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/2897937.2898102