Study of the (0 0 1) cleavage planes of guanidinium methanesulfonate single crystals by AFM and He diffraction

Gianangelo Bracco, Ying Hu, J. örg Acker, Michael Ward

Research output: Contribution to journalArticle

Abstract

The guanidinium methanesulfonate (GMS) is a layered self-assembled organic crystal. Its structure presents a bilayer architecture and two different (0 0 1) planes can be exposed upon cleavage. In a previous paper, we have studied both planes separately and we have shown that the analysis of the rate of decay in the thermal attenuation of the He atom elastic scattered intensities allows for distinguishing between the two possible (0 0 1) cleavage planes. In this paper we investigate by means of atomic force microscopy (AFM) and He diffraction the morphology of cleaved (0 0 1) surfaces in order to study the coexistence of the two different planes on the same crystal surface.

Original languageEnglish (US)
Pages (from-to)151-156
Number of pages6
JournalApplied Surface Science
Volume212-213
Issue numberSPEC.
DOIs
StatePublished - May 15 2003

Fingerprint

Guanidine
cleavage
Atomic force microscopy
Diffraction
Single crystals
atomic force microscopy
Crystals
single crystals
crystal surfaces
diffraction
attenuation
Atoms
decay
crystals
atoms
methanesulfonic acid
Hot Temperature

Keywords

  • Atomic force microscopy
  • He diffraction
  • Organic single crystal
  • Self-assembly
  • Surface morphology

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics

Cite this

Study of the (0 0 1) cleavage planes of guanidinium methanesulfonate single crystals by AFM and He diffraction. / Bracco, Gianangelo; Hu, Ying; Acker, J. örg; Ward, Michael.

In: Applied Surface Science, Vol. 212-213, No. SPEC., 15.05.2003, p. 151-156.

Research output: Contribution to journalArticle

Bracco, Gianangelo ; Hu, Ying ; Acker, J. örg ; Ward, Michael. / Study of the (0 0 1) cleavage planes of guanidinium methanesulfonate single crystals by AFM and He diffraction. In: Applied Surface Science. 2003 ; Vol. 212-213, No. SPEC. pp. 151-156.
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