Structural Characterization of a Pentacene Monolayer on an Amorphous SiO2 Substrate with Grazing Incidence X-ray Diffraction

Sandra E. Fritz, Stephen M. Martin, C. Daniel Frisbie, Michael Ward, Michael F. Toney

Research output: Contribution to journalArticle

Abstract

Grazing incidence X-ray diffraction reveals that a pentacene monolayer, grown on an amorphous SiO2 substrate that is commonly used as a dielectric layer in organic thin film transistors (OTFTs), is crystalline. A preliminary energy-minimized model of the monolayer, based on the GIXD data, reveals that the pentacene molecules adopt a herringbone arrangement with their long axes tilted slightly from the substrate normal. Although this arrangement resembles the general packing features of the (001) layer in single crystals of bulk pentacene, the monolayer lattice parameters and crystal structure differ from those of the bulk. Because carrier transport in pentacene OTFTs is presumed to occur in the semiconductor layers near the dielectric interface, the discovery of a crystalline monolayer structure on amorphous SiO2 has important implications for transport in OTFTs.

Original languageEnglish (US)
Pages (from-to)4084-4085
Number of pages2
JournalJournal of the American Chemical Society
Volume126
Issue number13
DOIs
StatePublished - Apr 7 2004

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X-Ray Diffraction
Monolayers
Thin film transistors
X ray diffraction
Incidence
Substrates
Crystalline materials
Semiconductors
Carrier transport
Lattice constants
Crystal structure
Single crystals
Semiconductor materials
Molecules
pentacene

ASJC Scopus subject areas

  • Chemistry(all)

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Structural Characterization of a Pentacene Monolayer on an Amorphous SiO2 Substrate with Grazing Incidence X-ray Diffraction. / Fritz, Sandra E.; Martin, Stephen M.; Frisbie, C. Daniel; Ward, Michael; Toney, Michael F.

In: Journal of the American Chemical Society, Vol. 126, No. 13, 07.04.2004, p. 4084-4085.

Research output: Contribution to journalArticle

Fritz, Sandra E. ; Martin, Stephen M. ; Frisbie, C. Daniel ; Ward, Michael ; Toney, Michael F. / Structural Characterization of a Pentacene Monolayer on an Amorphous SiO2 Substrate with Grazing Incidence X-ray Diffraction. In: Journal of the American Chemical Society. 2004 ; Vol. 126, No. 13. pp. 4084-4085.
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