Straight line extraction in binary drawings using morphological operations

Edward Wong, Y. Chen, S. Y. Ohn

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    In the analysis of grayscale images, straight line segments are usually extracted by using the Hough Transform method. Straight line detection using Hough Transform has the disadvantage that detecting peaks in the accumulator array is not always a reliable process. Thus, a significant amount of error may result. In this paper, we propose to extract straight line segments from binary images using binary morphological operations. In addition to the endpoint coordinates, the width of a line segment can also be reliably computed in the process. In the proposed approach, a set of line-shaped fixed-length structuring elements with orientation ranging from 0 to 180 degrees is used to extract line segments of all orientations. The algorithm is flexible for different applications. Line segments of different thickness, length, and orientation can be extracted with high precision. Experiment results we obtained on engineering map drawings demonstrate the good performance of the algorithm.

    Original languageEnglish (US)
    Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
    EditorsE.R. Dougherty, J.T. Astola
    Pages166-173
    Number of pages8
    Volume3304
    DOIs
    StatePublished - 1998
    EventNonlinear Image Processing IX - San Jose, CA, United States
    Duration: Jan 26 1998Jan 27 1998

    Other

    OtherNonlinear Image Processing IX
    CountryUnited States
    CitySan Jose, CA
    Period1/26/981/27/98

    Fingerprint

    Drawing (graphics)
    Hough transforms
    Binary images
    Experiments
    accumulators
    engineering

    Keywords

    • Document image processing
    • Line extraction
    • Morphology

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Condensed Matter Physics

    Cite this

    Wong, E., Chen, Y., & Ohn, S. Y. (1998). Straight line extraction in binary drawings using morphological operations. In E. R. Dougherty, & J. T. Astola (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3304, pp. 166-173) https://doi.org/10.1117/12.304596

    Straight line extraction in binary drawings using morphological operations. / Wong, Edward; Chen, Y.; Ohn, S. Y.

    Proceedings of SPIE - The International Society for Optical Engineering. ed. / E.R. Dougherty; J.T. Astola. Vol. 3304 1998. p. 166-173.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Wong, E, Chen, Y & Ohn, SY 1998, Straight line extraction in binary drawings using morphological operations. in ER Dougherty & JT Astola (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 3304, pp. 166-173, Nonlinear Image Processing IX, San Jose, CA, United States, 1/26/98. https://doi.org/10.1117/12.304596
    Wong E, Chen Y, Ohn SY. Straight line extraction in binary drawings using morphological operations. In Dougherty ER, Astola JT, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3304. 1998. p. 166-173 https://doi.org/10.1117/12.304596
    Wong, Edward ; Chen, Y. ; Ohn, S. Y. / Straight line extraction in binary drawings using morphological operations. Proceedings of SPIE - The International Society for Optical Engineering. editor / E.R. Dougherty ; J.T. Astola. Vol. 3304 1998. pp. 166-173
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