Spectral-domain analysis of complex characteristic impedance of a leaky conductor-backed slotline

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We define an `equivalent complex characteristic impedance' for a conductor-backed slotline, that can be useful for circuit modeling purposes. Standard methods for computing the characteristic impedance of non-leaky transmission lines would not apply to a conductor-backed slotline due to its non-standard leakage behavior. Two alternate methods are proposed, that are compared with each other, as well as validated by comparing with rigorous 3D simulations of a practical circuit geometry.

Original languageEnglish (US)
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
PublisherIEEE
Pages1791-1794
Number of pages4
Volume3
StatePublished - 1996
EventProceedings of the 1996 IEEE MTT-S International Microwave Symposium Digest. Part 1 (of 3) - San Franscisco, CA, USA
Duration: Jun 17 1996Jun 21 1996

Other

OtherProceedings of the 1996 IEEE MTT-S International Microwave Symposium Digest. Part 1 (of 3)
CitySan Franscisco, CA, USA
Period6/17/966/21/96

Fingerprint

conductors
impedance
Networks (circuits)
transmission lines
Electric lines
leakage
Geometry
geometry
simulation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Das, N. (1996). Spectral-domain analysis of complex characteristic impedance of a leaky conductor-backed slotline. In IEEE MTT-S International Microwave Symposium Digest (Vol. 3, pp. 1791-1794). IEEE.

Spectral-domain analysis of complex characteristic impedance of a leaky conductor-backed slotline. / Das, Nirod.

IEEE MTT-S International Microwave Symposium Digest. Vol. 3 IEEE, 1996. p. 1791-1794.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Das, N 1996, Spectral-domain analysis of complex characteristic impedance of a leaky conductor-backed slotline. in IEEE MTT-S International Microwave Symposium Digest. vol. 3, IEEE, pp. 1791-1794, Proceedings of the 1996 IEEE MTT-S International Microwave Symposium Digest. Part 1 (of 3), San Franscisco, CA, USA, 6/17/96.
Das N. Spectral-domain analysis of complex characteristic impedance of a leaky conductor-backed slotline. In IEEE MTT-S International Microwave Symposium Digest. Vol. 3. IEEE. 1996. p. 1791-1794
Das, Nirod. / Spectral-domain analysis of complex characteristic impedance of a leaky conductor-backed slotline. IEEE MTT-S International Microwave Symposium Digest. Vol. 3 IEEE, 1996. pp. 1791-1794
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