Shear force distance control in a scanning near-field optical microscope

In resonance excitation of the fiber probe versus out of resonance excitation

D. A. Lapshin, V. S. Letokhov, George Shubeita, S. K. Sekatskii, G. Dietler

    Research output: Contribution to journalArticle

    Abstract

    The experimental results of the direct measurement of the absolute value of interaction force between the fiber probe of a scanning near-field optical microscope (SNOM) operated in shear force mode and a sample, which were performed using combined SNOM-atomic force microscope setup, are discussed for the out-of-resonance fiber probe excitation mode. We demonstrate that the value of the tapping component of the total force for this mode at typical dither amplitudes is of the order of 10nN and thus is quite comparable with the value of this force for in resonance fiber probe excitation mode. It is also shown that for all modes this force component is essentially smaller than the usually neglected static attraction force, which is of the order of 200nN. The true contact nature of the tip-sample interaction during the out of resonance mode is proven. From this, we conclude that such a detection mode is very promising for operation in liquids, where other modes encounter great difficulties.

    Original languageEnglish (US)
    Pages (from-to)227-233
    Number of pages7
    JournalUltramicroscopy
    Volume99
    Issue number4
    DOIs
    StatePublished - Jun 1 2004

    Fingerprint

    optical microscopes
    near fields
    Microscopes
    shear
    Scanning
    scanning
    fibers
    Fibers
    probes
    excitation
    Liquids
    dithers
    encounters
    attraction
    microscopes
    interactions
    liquids

    Keywords

    • 07.79.Fc
    • 19
    • 46.55.+d
    • Scanning near-field optical microscopy
    • Shear force

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Instrumentation

    Cite this

    Shear force distance control in a scanning near-field optical microscope : In resonance excitation of the fiber probe versus out of resonance excitation. / Lapshin, D. A.; Letokhov, V. S.; Shubeita, George; Sekatskii, S. K.; Dietler, G.

    In: Ultramicroscopy, Vol. 99, No. 4, 01.06.2004, p. 227-233.

    Research output: Contribution to journalArticle

    Lapshin, D. A. ; Letokhov, V. S. ; Shubeita, George ; Sekatskii, S. K. ; Dietler, G. / Shear force distance control in a scanning near-field optical microscope : In resonance excitation of the fiber probe versus out of resonance excitation. In: Ultramicroscopy. 2004 ; Vol. 99, No. 4. pp. 227-233.
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    AU - Sekatskii, S. K.

    AU - Dietler, G.

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