Shear force distance control in a scanning near-field optical microscope: In resonance excitation of the fiber probe versus out of resonance excitation

D. A. Lapshin, V. S. Letokhov, George Shubeita, S. K. Sekatskii, G. Dietler

Research output: Contribution to journalArticle

Abstract

The experimental results of the direct measurement of the absolute value of interaction force between the fiber probe of a scanning near-field optical microscope (SNOM) operated in shear force mode and a sample, which were performed using combined SNOM-atomic force microscope setup, are discussed for the out-of-resonance fiber probe excitation mode. We demonstrate that the value of the tapping component of the total force for this mode at typical dither amplitudes is of the order of 10nN and thus is quite comparable with the value of this force for in resonance fiber probe excitation mode. It is also shown that for all modes this force component is essentially smaller than the usually neglected static attraction force, which is of the order of 200nN. The true contact nature of the tip-sample interaction during the out of resonance mode is proven. From this, we conclude that such a detection mode is very promising for operation in liquids, where other modes encounter great difficulties.

Original languageEnglish (US)
Pages (from-to)227-233
Number of pages7
JournalUltramicroscopy
Volume99
Issue number4
DOIs
StatePublished - Jun 1 2004

Fingerprint

optical microscopes
near fields
Microscopes
shear
Scanning
scanning
fibers
Fibers
probes
excitation
Liquids
dithers
encounters
attraction
microscopes
interactions
liquids

Keywords

  • 07.79.Fc
  • 19
  • 46.55.+d
  • Scanning near-field optical microscopy
  • Shear force

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

Shear force distance control in a scanning near-field optical microscope : In resonance excitation of the fiber probe versus out of resonance excitation. / Lapshin, D. A.; Letokhov, V. S.; Shubeita, George; Sekatskii, S. K.; Dietler, G.

In: Ultramicroscopy, Vol. 99, No. 4, 01.06.2004, p. 227-233.

Research output: Contribution to journalArticle

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