Sequence estimation of piled-up pulses in synchrotron-based XAFS

P. J. Pietraski, Peter Voltz, L. R. Furenlid

Research output: Contribution to journalArticle

Abstract

Signal processing techniques are being developed that allow XAFS and diffraction experiments employing solid state detectors to be carried out at higher count rates by resolving shaper pulses that would otherwise be rejected or corrupted due to pile-up. This method exploits the time structure of the synchrotron generated radiation and a priori knowledge of the incident and fluorescence energies to perform sequence of event estimation based on periodically sampled observations of the shaper amplifier output. Isolated pulses are processed with a simple threshold decision much like an SCA while non-isolated pulses that produce sequence segments of finite length are processed as vectors. Once the vector is estimated, the number of fluorescence and scatter events is counted. Since these piled-up pulses are not rejected, the over all count rate of the experiment is increased.

Original languageEnglish (US)
Pages (from-to)152-154
Number of pages3
JournalJournal of Synchrotron Radiation
Volume6
Issue number3
StatePublished - May 1 1999

Fingerprint

Synchrotrons
synchrotrons
Fluorescence
shapers
pulses
Piles
Signal processing
Diffraction
Experiments
Detectors
Radiation
fluorescence
piles
signal processing
amplifiers
solid state
thresholds
output
detectors
radiation

Keywords

  • Detectors
  • Inter-pulse interference
  • Pile-up
  • Time structure

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Radiation

Cite this

Sequence estimation of piled-up pulses in synchrotron-based XAFS. / Pietraski, P. J.; Voltz, Peter; Furenlid, L. R.

In: Journal of Synchrotron Radiation, Vol. 6, No. 3, 01.05.1999, p. 152-154.

Research output: Contribution to journalArticle

Pietraski, P. J. ; Voltz, Peter ; Furenlid, L. R. / Sequence estimation of piled-up pulses in synchrotron-based XAFS. In: Journal of Synchrotron Radiation. 1999 ; Vol. 6, No. 3. pp. 152-154.
@article{03b3e881467f463bbb64696cd48a45cd,
title = "Sequence estimation of piled-up pulses in synchrotron-based XAFS",
abstract = "Signal processing techniques are being developed that allow XAFS and diffraction experiments employing solid state detectors to be carried out at higher count rates by resolving shaper pulses that would otherwise be rejected or corrupted due to pile-up. This method exploits the time structure of the synchrotron generated radiation and a priori knowledge of the incident and fluorescence energies to perform sequence of event estimation based on periodically sampled observations of the shaper amplifier output. Isolated pulses are processed with a simple threshold decision much like an SCA while non-isolated pulses that produce sequence segments of finite length are processed as vectors. Once the vector is estimated, the number of fluorescence and scatter events is counted. Since these piled-up pulses are not rejected, the over all count rate of the experiment is increased.",
keywords = "Detectors, Inter-pulse interference, Pile-up, Time structure",
author = "Pietraski, {P. J.} and Peter Voltz and Furenlid, {L. R.}",
year = "1999",
month = "5",
day = "1",
language = "English (US)",
volume = "6",
pages = "152--154",
journal = "Journal of Synchrotron Radiation",
issn = "0909-0495",
publisher = "International Union of Crystallography",
number = "3",

}

TY - JOUR

T1 - Sequence estimation of piled-up pulses in synchrotron-based XAFS

AU - Pietraski, P. J.

AU - Voltz, Peter

AU - Furenlid, L. R.

PY - 1999/5/1

Y1 - 1999/5/1

N2 - Signal processing techniques are being developed that allow XAFS and diffraction experiments employing solid state detectors to be carried out at higher count rates by resolving shaper pulses that would otherwise be rejected or corrupted due to pile-up. This method exploits the time structure of the synchrotron generated radiation and a priori knowledge of the incident and fluorescence energies to perform sequence of event estimation based on periodically sampled observations of the shaper amplifier output. Isolated pulses are processed with a simple threshold decision much like an SCA while non-isolated pulses that produce sequence segments of finite length are processed as vectors. Once the vector is estimated, the number of fluorescence and scatter events is counted. Since these piled-up pulses are not rejected, the over all count rate of the experiment is increased.

AB - Signal processing techniques are being developed that allow XAFS and diffraction experiments employing solid state detectors to be carried out at higher count rates by resolving shaper pulses that would otherwise be rejected or corrupted due to pile-up. This method exploits the time structure of the synchrotron generated radiation and a priori knowledge of the incident and fluorescence energies to perform sequence of event estimation based on periodically sampled observations of the shaper amplifier output. Isolated pulses are processed with a simple threshold decision much like an SCA while non-isolated pulses that produce sequence segments of finite length are processed as vectors. Once the vector is estimated, the number of fluorescence and scatter events is counted. Since these piled-up pulses are not rejected, the over all count rate of the experiment is increased.

KW - Detectors

KW - Inter-pulse interference

KW - Pile-up

KW - Time structure

UR - http://www.scopus.com/inward/record.url?scp=0033435369&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033435369&partnerID=8YFLogxK

M3 - Article

C2 - 15263230

AN - SCOPUS:0033435369

VL - 6

SP - 152

EP - 154

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

SN - 0909-0495

IS - 3

ER -