Secure memristor-based main memory

Sachhidh Kannan, Naghmeh Karimi, Ozgur Sinanoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Non-volatile memory devices such as phase change mem-ories and memristors are promising alternatives to SRAM and DRAM main memories as they provide higher den-sity and improved energy effciency. However, non-volatile main memories (NVMM) introduce security vulnerabilities. Sensitive data such as passwords and keys residing in the NVMM will persist and can be probed after power down. We propose sneak-path encryption (SPE), for memristor-based NVMM. SPE exploits the physical parameters, multi-level cell (MLC) capability and the sneak paths in cross-bar memories to encrypt the data stored in memristor-based NVMM. We investigate three attacks on NVMMs and show the resilience of SPE against them. We use a cycle accurate simulator to evaluate the security and performance impact of SPE based NVMM. SPE can secure the NVMM with a latency of 16 cycles and ̃1.5% performance overhead.

Original languageEnglish (US)
Title of host publicationDAC 2014 - 51st Design Automation Conference, Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479930173
DOIs
StatePublished - Jan 1 2014
Event51st Annual Design Automation Conference, DAC 2014 - San Francisco, CA, United States
Duration: Jun 2 2014Jun 5 2014

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Other

Other51st Annual Design Automation Conference, DAC 2014
CountryUnited States
CitySan Francisco, CA
Period6/2/146/5/14

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation

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  • Cite this

    Kannan, S., Karimi, N., & Sinanoglu, O. (2014). Secure memristor-based main memory. In DAC 2014 - 51st Design Automation Conference, Conference Proceedings [2593212] (Proceedings - Design Automation Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/2593069.2593212