Scanning tunneling microscopy studies of organic conductors

Shulong Li, Henry S. White, Michael Ward

Research output: Contribution to journalArticle

Abstract

Scanning tunneling microscopy (STM) studies of a series of single crystals of organic conductors revea; topographical and electronic structure of specific crystal planes, these planes exhibiting molecularly flat large areas. For example, scanning tunneling microscopy (STM) images of the (001) face of the organic conductors (TMTSF)2X (TMTSF = tetramethyltetraselenafulvalene; X = ClO4-, ReO4-) reveal significant differences in the local density of states associated with the transverse band structure in these two compounds. STM studies of the (001) and (010) faces of [(η-C5Me5)2Ru(η66-[22](1,4)cyclophane)]2+[TCNQ]4 2- reveal tunneling current corrugation attributed to tunneling into the conduction band of a antiferromagnetic 2kF charge density wave (CDW) structure. The CDWs also exhibit antiphase modulation at a/2 with respect to adjacent stacks, consistent with appreciable interstack Coulomb interactions and contributions from the magnetic 4kF structure.

Original languageEnglish (US)
Pages (from-to)426-433
Number of pages8
JournalSynthetic Metals
Volume55
Issue number1
DOIs
StatePublished - Mar 15 1993

Fingerprint

Organic conductors
Scanning tunneling microscopy
scanning tunneling microscopy
conductors
Charge density waves
Magnetic structure
Coulomb interactions
Conduction bands
Band structure
Electronic structure
conduction bands
Modulation
Single crystals
electronic structure
modulation
Crystals
single crystals
crystals
interactions

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Polymers and Plastics

Cite this

Scanning tunneling microscopy studies of organic conductors. / Li, Shulong; White, Henry S.; Ward, Michael.

In: Synthetic Metals, Vol. 55, No. 1, 15.03.1993, p. 426-433.

Research output: Contribution to journalArticle

Li, Shulong ; White, Henry S. ; Ward, Michael. / Scanning tunneling microscopy studies of organic conductors. In: Synthetic Metals. 1993 ; Vol. 55, No. 1. pp. 426-433.
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