Scanning tunneling and atomic force microscopy of electrochemical interfaces

Michael D. Ward, Henry S. White

Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

Original languageEnglish (US)
Title of host publicationModern techniques in electroanalysis
EditorsPetr Vanysek
Place of PublicationNew York
PublisherWiley
Pages107-149
Number of pages43
Volume139
StatePublished - 1996

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Atomic force microscopy
Scanning

ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

Ward, M. D., & White, H. S. (1996). Scanning tunneling and atomic force microscopy of electrochemical interfaces. In P. Vanysek (Ed.), Modern techniques in electroanalysis (Vol. 139, pp. 107-149). New York: Wiley.

Scanning tunneling and atomic force microscopy of electrochemical interfaces. / Ward, Michael D.; White, Henry S.

Modern techniques in electroanalysis. ed. / Petr Vanysek. Vol. 139 New York : Wiley, 1996. p. 107-149.

Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

Ward, MD & White, HS 1996, Scanning tunneling and atomic force microscopy of electrochemical interfaces. in P Vanysek (ed.), Modern techniques in electroanalysis. vol. 139, Wiley, New York, pp. 107-149.
Ward MD, White HS. Scanning tunneling and atomic force microscopy of electrochemical interfaces. In Vanysek P, editor, Modern techniques in electroanalysis. Vol. 139. New York: Wiley. 1996. p. 107-149
Ward, Michael D. ; White, Henry S. / Scanning tunneling and atomic force microscopy of electrochemical interfaces. Modern techniques in electroanalysis. editor / Petr Vanysek. Vol. 139 New York : Wiley, 1996. pp. 107-149
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