Scanning near-field optical microscopy using semiconductor nanocrystals as a local fluorescence and fluorescence resonance energy transfer source

George Shubeita, S. K. Sekatskii, G. Dietler, I. Potapova, A. Mews, T. Basché

Research output: Contribution to journalArticle

Abstract

Local fluorescence probes based on CdSe semiconductor nanocrystals were prepared and tested by recording scanning near-field optical microscopy (SNOM) images of calibration samples and fluorescence resonance energy transfer SNOM (FRET SNOM) images of acceptor dye molecules in homogeneously deposited onto a glass substrate. Thousands of nanocrystals contribute to the signal when this probe is used as a local fluorescence source while only tens of those (the most apical) are involved in imaging for the FRET SNOM operation mode. The dip-coating method used to make the probe enables diminishing the number of active fluorescent nanocrystals easily. Prospects to realize FRET SNOM based on a single fluorescence centre using such an approach are briefly described.

Original languageEnglish (US)
Pages (from-to)274-278
Number of pages5
JournalJournal of Microscopy
Volume210
Issue number3
DOIs
StatePublished - Jun 1 2003

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Quantum Dots
Fluorescence Resonance Energy Transfer
Microscopy
Fluorescence
Nanoparticles
Calibration
Glass
Coloring Agents

Keywords

  • Fluorescence resonance energy transfer
  • Near-field optics
  • Semiconductor nanocrystals

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology

Cite this

Scanning near-field optical microscopy using semiconductor nanocrystals as a local fluorescence and fluorescence resonance energy transfer source. / Shubeita, George; Sekatskii, S. K.; Dietler, G.; Potapova, I.; Mews, A.; Basché, T.

In: Journal of Microscopy, Vol. 210, No. 3, 01.06.2003, p. 274-278.

Research output: Contribution to journalArticle

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AU - Basché, T.

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