Scanning near-field optical microscopy using semiconductor nanocrystals as a local fluorescence and fluorescence resonance energy transfer source

George Shubeita, S. K. Sekatskii, G. Dietler, I. Potapova, A. Mews, T. Basché

    Research output: Contribution to journalArticle

    Abstract

    Local fluorescence probes based on CdSe semiconductor nanocrystals were prepared and tested by recording scanning near-field optical microscopy (SNOM) images of calibration samples and fluorescence resonance energy transfer SNOM (FRET SNOM) images of acceptor dye molecules in homogeneously deposited onto a glass substrate. Thousands of nanocrystals contribute to the signal when this probe is used as a local fluorescence source while only tens of those (the most apical) are involved in imaging for the FRET SNOM operation mode. The dip-coating method used to make the probe enables diminishing the number of active fluorescent nanocrystals easily. Prospects to realize FRET SNOM based on a single fluorescence centre using such an approach are briefly described.

    Original languageEnglish (US)
    Pages (from-to)274-278
    Number of pages5
    JournalJournal of Microscopy
    Volume210
    Issue number3
    DOIs
    StatePublished - Jun 1 2003

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    Quantum Dots
    Fluorescence Resonance Energy Transfer
    Microscopy
    Fluorescence
    Nanoparticles
    Calibration
    Glass
    Coloring Agents

    Keywords

    • Fluorescence resonance energy transfer
    • Near-field optics
    • Semiconductor nanocrystals

    ASJC Scopus subject areas

    • Pathology and Forensic Medicine
    • Histology

    Cite this

    Scanning near-field optical microscopy using semiconductor nanocrystals as a local fluorescence and fluorescence resonance energy transfer source. / Shubeita, George; Sekatskii, S. K.; Dietler, G.; Potapova, I.; Mews, A.; Basché, T.

    In: Journal of Microscopy, Vol. 210, No. 3, 01.06.2003, p. 274-278.

    Research output: Contribution to journalArticle

    Shubeita, George ; Sekatskii, S. K. ; Dietler, G. ; Potapova, I. ; Mews, A. ; Basché, T. / Scanning near-field optical microscopy using semiconductor nanocrystals as a local fluorescence and fluorescence resonance energy transfer source. In: Journal of Microscopy. 2003 ; Vol. 210, No. 3. pp. 274-278.
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    AU - Dietler, G.

    AU - Potapova, I.

    AU - Mews, A.

    AU - Basché, T.

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