Scanning electron microscope evaluation of CEREC II and CEREC III inlays

Denise Estafan, Floyd Dussetschleger, Claudine Agosta, Sven Reich

Research output: Contribution to journalArticle

Abstract

In response to an increased public demand for esthetic restorations, dentists are using computer-aided design/computer-aided manufacture (CAD/CAM) technology to fabricate inlay/onlay, crown, and laminate veneers. This study evaluated the fit at the gingival margin of surface inlay restorations milled by the CEREC II as well as the more recently developed CEREC III. The marginal fit of inlays milled by the CEREC III was more accurate than the fit of those milled by the CEREC II, although both were within the ADA specifications of 50 μ.

Original languageEnglish (US)
Pages (from-to)450-454
Number of pages5
JournalGeneral Dentistry
Volume51
Issue number5
StatePublished - Sep 2003

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Inlays
Electrons
Computer-Aided Design
Dentists
Crowns
Esthetics
Technology

ASJC Scopus subject areas

  • Dentistry(all)

Cite this

Estafan, D., Dussetschleger, F., Agosta, C., & Reich, S. (2003). Scanning electron microscope evaluation of CEREC II and CEREC III inlays. General Dentistry, 51(5), 450-454.

Scanning electron microscope evaluation of CEREC II and CEREC III inlays. / Estafan, Denise; Dussetschleger, Floyd; Agosta, Claudine; Reich, Sven.

In: General Dentistry, Vol. 51, No. 5, 09.2003, p. 450-454.

Research output: Contribution to journalArticle

Estafan, D, Dussetschleger, F, Agosta, C & Reich, S 2003, 'Scanning electron microscope evaluation of CEREC II and CEREC III inlays', General Dentistry, vol. 51, no. 5, pp. 450-454.
Estafan D, Dussetschleger F, Agosta C, Reich S. Scanning electron microscope evaluation of CEREC II and CEREC III inlays. General Dentistry. 2003 Sep;51(5):450-454.
Estafan, Denise ; Dussetschleger, Floyd ; Agosta, Claudine ; Reich, Sven. / Scanning electron microscope evaluation of CEREC II and CEREC III inlays. In: General Dentistry. 2003 ; Vol. 51, No. 5. pp. 450-454.
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