Repulsive interaction of Neel walls, and the internal length scale of the cross-tie wall

A Desimone, RV Kohn, S Muller, F Otto

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)57-104
JournalMultiscale Modeling and Simulation
Volume1
Issue number1
StatePublished - 2003

Keywords

  • micromagnetics
  • thin films
  • Neel wall
  • cross-tie wall

Cite this

Repulsive interaction of Neel walls, and the internal length scale of the cross-tie wall. / Desimone, A; Kohn, RV; Muller, S; Otto, F.

In: Multiscale Modeling and Simulation, Vol. 1, No. 1, 2003, p. 57-104.

Research output: Contribution to journalArticle

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issn = "1540-3459",
publisher = "Society for Industrial and Applied Mathematics Publications",
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KW - micromagnetics

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