Repulsive interaction of Neel walls, and the internal length scale of the cross-tie wall

A Desimone, RV Kohn, S Muller, F Otto

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)57-104
JournalMultiscale Modeling and Simulation
Volume1
Issue number1
StatePublished - 2003

Keywords

  • micromagnetics
  • thin films
  • Neel wall
  • cross-tie wall

Cite this