Reconfigurable Concurrent Error Detection adaptive to dynamicity of power constraints

Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    In this preliminary study, we evaluate a reconfigurable low-power duplication-based Concurrent Error Detection (CED) infrastructure for logic circuits. The key idea is to enable/disable the operation of the duplicate circuit, resulting in the retention of the input values to the duplicate circuit (i.e., reduction in power dissipation) at the cost of some reduction in CED coverage. The results indicate that power dissipation is commensurate with CED coverage, motivating the use of LFSR structures to easily generate and reconfigure conditions, enabling their dynamic adjustment to adapt to the power constraints of the system.

    Original languageEnglish (US)
    Title of host publication2010 15th IEEE European Test Symposium, ETS'10
    Number of pages1
    DOIs
    StatePublished - Nov 3 2010
    Event2010 15th IEEE European Test Symposium, ETS'10 - Prague, Czech Republic
    Duration: May 24 2010May 28 2010

    Other

    Other2010 15th IEEE European Test Symposium, ETS'10
    CountryCzech Republic
    CityPrague
    Period5/24/105/28/10

    Fingerprint

    Error detection
    Energy dissipation
    Networks (circuits)
    Logic circuits

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

    Cite this

    Almukhaizim, S., Bunian, S., & Sinanoglu, O. (2010). Reconfigurable Concurrent Error Detection adaptive to dynamicity of power constraints. In 2010 15th IEEE European Test Symposium, ETS'10 [5512745] https://doi.org/10.1109/ETSYM.2010.5512745

    Reconfigurable Concurrent Error Detection adaptive to dynamicity of power constraints. / Almukhaizim, Sobeeh; Bunian, Sara; Sinanoglu, Ozgur.

    2010 15th IEEE European Test Symposium, ETS'10. 2010. 5512745.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Almukhaizim, S, Bunian, S & Sinanoglu, O 2010, Reconfigurable Concurrent Error Detection adaptive to dynamicity of power constraints. in 2010 15th IEEE European Test Symposium, ETS'10., 5512745, 2010 15th IEEE European Test Symposium, ETS'10, Prague, Czech Republic, 5/24/10. https://doi.org/10.1109/ETSYM.2010.5512745
    Almukhaizim S, Bunian S, Sinanoglu O. Reconfigurable Concurrent Error Detection adaptive to dynamicity of power constraints. In 2010 15th IEEE European Test Symposium, ETS'10. 2010. 5512745 https://doi.org/10.1109/ETSYM.2010.5512745
    Almukhaizim, Sobeeh ; Bunian, Sara ; Sinanoglu, Ozgur. / Reconfigurable Concurrent Error Detection adaptive to dynamicity of power constraints. 2010 15th IEEE European Test Symposium, ETS'10. 2010.
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