Recent advances in multiresolution analysis of 3D meshes and their applications

Michaël Roy, Sebti Foufou, Frédéric Truchetet

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

3D meshes are widely used in computer graphics applications for approximating 3D models. When representing complex shapes in raw data format, meshes consume a large amount of space. Applications calling for compact and fast processing of large 3D meshes have motivated a multitude of algorithms developped to process these datasets efficiently. The concept of multiresolution analysis proposes an efficient and versatile tool for digital geometric processing allowing for numerous applications. In this paper, we survey recent developments in multiresolution methods for 3D triangle meshes. We also show some results of these methods through various applications.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE-IS and T Electronic Imaging - Wavelet Applications in Industrial Processing VII
DOIs
StatePublished - May 13 2010
EventWavelet Applications in Industrial Processing VII - San Jose, CA, United States
Duration: Jan 18 2010Jan 19 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7535
ISSN (Print)0277-786X

Other

OtherWavelet Applications in Industrial Processing VII
CountryUnited States
CitySan Jose, CA
Period1/18/101/19/10

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Keywords

  • 3D triangle mesh
  • Applications
  • Levels of detail
  • Multiresolution analysis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Roy, M., Foufou, S., & Truchetet, F. (2010). Recent advances in multiresolution analysis of 3D meshes and their applications. In Proceedings of SPIE-IS and T Electronic Imaging - Wavelet Applications in Industrial Processing VII [75350H] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7535). https://doi.org/10.1117/12.845595