PROXIMITY EFFECT TUNNELLING AS A PROBE OF METALLURGICAL PROCESSES IN THIN FILMS.

B. F. Donovan-Vojtovic, S. A. Dodds, M. S. Nasser, P. M. Chaikin

    Research output: Chapter in Book/Report/Conference proceedingChapter

    Abstract

    Electron tunneling in a junction of the form Al-oxide-M//1-M//2, where M//1 and M//2 are metals at least one of which is a superconductor, reveals structure at the phonon frequencies of both M//1 and M//2. For thin films peaks in the phonon density of states from M//1 appear as dips in d**2V/dI**2 whereas peaks in the phonon density of states from M//2 appear inverted. It is therefore possible to determine which metal is adjacent to the oxide and to monitor changes in this material as diffusion, alloying or formation of intermetallics take place in films as thin as 200 A.

    Original languageEnglish (US)
    Title of host publicationPhilos Mag
    Pages893-901
    Number of pages9
    Volume34
    Edition5
    StatePublished - Nov 1976

    Fingerprint

    Thin films
    Oxides
    Electron tunneling
    Metals
    Alloying
    Superconducting materials
    Intermetallics

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Donovan-Vojtovic, B. F., Dodds, S. A., Nasser, M. S., & Chaikin, P. M. (1976). PROXIMITY EFFECT TUNNELLING AS A PROBE OF METALLURGICAL PROCESSES IN THIN FILMS. In Philos Mag (5 ed., Vol. 34, pp. 893-901)

    PROXIMITY EFFECT TUNNELLING AS A PROBE OF METALLURGICAL PROCESSES IN THIN FILMS. / Donovan-Vojtovic, B. F.; Dodds, S. A.; Nasser, M. S.; Chaikin, P. M.

    Philos Mag. Vol. 34 5. ed. 1976. p. 893-901.

    Research output: Chapter in Book/Report/Conference proceedingChapter

    Donovan-Vojtovic, BF, Dodds, SA, Nasser, MS & Chaikin, PM 1976, PROXIMITY EFFECT TUNNELLING AS A PROBE OF METALLURGICAL PROCESSES IN THIN FILMS. in Philos Mag. 5 edn, vol. 34, pp. 893-901.
    Donovan-Vojtovic BF, Dodds SA, Nasser MS, Chaikin PM. PROXIMITY EFFECT TUNNELLING AS A PROBE OF METALLURGICAL PROCESSES IN THIN FILMS. In Philos Mag. 5 ed. Vol. 34. 1976. p. 893-901
    Donovan-Vojtovic, B. F. ; Dodds, S. A. ; Nasser, M. S. ; Chaikin, P. M. / PROXIMITY EFFECT TUNNELLING AS A PROBE OF METALLURGICAL PROCESSES IN THIN FILMS. Philos Mag. Vol. 34 5. ed. 1976. pp. 893-901
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