Propagation path loss models for 5G urban micro-and macro-cellular scenarios

Shu Sun, Theodore Rappaport, Sundeep Rangan, Timothy A. Thomas, Amitava Ghosh, Istvan Z. Kovacs, Ignacio Rodriguez, Ozge Koymen, Andrzej Partyka, Jan Jarvelainen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents and compares two candidate large-scale propagation path loss models, the alpha-beta-gamma (ABG) model and the close-in (CI) free space reference distance model, for the design of fifth generation (5G) wireless communication systems in urban micro- and macro-cellular scenarios. Comparisons are made using the data obtained from 20 propagation measurement campaigns or ray- tracing studies from 2 GHz to 73.5 GHz over distances ranging from 5 m to 1429 m. The results show that the one-parameter CI model has a very similar goodness of fit (i.e., the shadow fading standard deviation) in both line-of-sight and non-line-of-sight environments, while offering substantial simplicity and more stable behavior across frequencies and distances, as compared to the three-parameter ABG model. Additionally, the CI model needs only one very subtle and simple modification to the existing 3GPP floating-intercept path loss model (replacing a constant with a close-in free space reference value) in order to provide greater simulation accuracy, more simplicity, better repeatability across experiments, and higher stability across a vast range of frequencies.

Original languageEnglish (US)
Title of host publication2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2016-July
ISBN (Electronic)9781509016983
DOIs
StatePublished - Jul 5 2016
Event83rd IEEE Vehicular Technology Conference, VTC Spring 2016 - Nanjing, China
Duration: May 15 2016May 18 2016

Other

Other83rd IEEE Vehicular Technology Conference, VTC Spring 2016
CountryChina
CityNanjing
Period5/15/165/18/16

Fingerprint

Path Loss
Macros
Propagation
Scenarios
Free Space
Simplicity
Model
Ray Tracing
Repeatability
Intercept
Ray tracing
Goodness of fit
Fading
Wireless Communication
Standard deviation
Communication Systems
Communication systems
Line
Range of data
Experiment

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

Sun, S., Rappaport, T., Rangan, S., Thomas, T. A., Ghosh, A., Kovacs, I. Z., ... Jarvelainen, J. (2016). Propagation path loss models for 5G urban micro-and macro-cellular scenarios. In 2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings (Vol. 2016-July). [7504435] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VTCSpring.2016.7504435

Propagation path loss models for 5G urban micro-and macro-cellular scenarios. / Sun, Shu; Rappaport, Theodore; Rangan, Sundeep; Thomas, Timothy A.; Ghosh, Amitava; Kovacs, Istvan Z.; Rodriguez, Ignacio; Koymen, Ozge; Partyka, Andrzej; Jarvelainen, Jan.

2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings. Vol. 2016-July Institute of Electrical and Electronics Engineers Inc., 2016. 7504435.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sun, S, Rappaport, T, Rangan, S, Thomas, TA, Ghosh, A, Kovacs, IZ, Rodriguez, I, Koymen, O, Partyka, A & Jarvelainen, J 2016, Propagation path loss models for 5G urban micro-and macro-cellular scenarios. in 2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings. vol. 2016-July, 7504435, Institute of Electrical and Electronics Engineers Inc., 83rd IEEE Vehicular Technology Conference, VTC Spring 2016, Nanjing, China, 5/15/16. https://doi.org/10.1109/VTCSpring.2016.7504435
Sun S, Rappaport T, Rangan S, Thomas TA, Ghosh A, Kovacs IZ et al. Propagation path loss models for 5G urban micro-and macro-cellular scenarios. In 2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings. Vol. 2016-July. Institute of Electrical and Electronics Engineers Inc. 2016. 7504435 https://doi.org/10.1109/VTCSpring.2016.7504435
Sun, Shu ; Rappaport, Theodore ; Rangan, Sundeep ; Thomas, Timothy A. ; Ghosh, Amitava ; Kovacs, Istvan Z. ; Rodriguez, Ignacio ; Koymen, Ozge ; Partyka, Andrzej ; Jarvelainen, Jan. / Propagation path loss models for 5G urban micro-and macro-cellular scenarios. 2016 IEEE 83rd Vehicular Technology Conference, VTC Spring 2016 - Proceedings. Vol. 2016-July Institute of Electrical and Electronics Engineers Inc., 2016.
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