Predictive analysis for projecting test compression levels

Ozgur Sinanoglu, Sobeeh Almukhaizim

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Test data compression is widely employed in scan designs to tackle high test data volume and test time problems. Given the number of scan-in pins available in the ATE, architectural decisions regarding the number of internal scan chains directly impact the compression level attained. While targeting an aggressive compression level by increasing the number of internal scan chains would reduce the test data volume per encodable pattern, the cost of applying more patterns serially, to restore the coverage loss, offsets the compression benefits. Therefore, a predictive analysis is necessary to determine the best possible compression configuration, enabling the designers to make DfT architectural decisions early on in the design cycle to minimize test costs. In this paper, we propose a suite of predictive techniques geared towards projecting test cost for any given compression-based scan configuration. T he appropriate technique is selected by designers based on which stage the design is in, the design abstraction and the amount of information available, the permissible computational complexity of the techniques, and the accuracy of the projected optimal compression ratio.

    Original languageEnglish (US)
    Title of host publicationProceedings - International Test Conference 2010, ITC 2010
    DOIs
    StatePublished - Dec 1 2010
    Event41st International Test Conference, ITC 2010 - Austin, TX, United States
    Duration: Oct 31 2010Nov 5 2010

    Other

    Other41st International Test Conference, ITC 2010
    CountryUnited States
    CityAustin, TX
    Period10/31/1011/5/10

    Fingerprint

    Compression
    Costs
    Data compression
    Internal
    Computational complexity
    Configuration
    Data Compression
    Predictive analytics
    Computational Complexity
    Coverage
    Minimise
    Cycle
    Necessary
    Design
    Architecture

    ASJC Scopus subject areas

    • Applied Mathematics
    • Electrical and Electronic Engineering

    Cite this

    Sinanoglu, O., & Almukhaizim, S. (2010). Predictive analysis for projecting test compression levels. In Proceedings - International Test Conference 2010, ITC 2010 [5699228] https://doi.org/10.1109/TEST.2010.5699228

    Predictive analysis for projecting test compression levels. / Sinanoglu, Ozgur; Almukhaizim, Sobeeh.

    Proceedings - International Test Conference 2010, ITC 2010. 2010. 5699228.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Sinanoglu, O & Almukhaizim, S 2010, Predictive analysis for projecting test compression levels. in Proceedings - International Test Conference 2010, ITC 2010., 5699228, 41st International Test Conference, ITC 2010, Austin, TX, United States, 10/31/10. https://doi.org/10.1109/TEST.2010.5699228
    Sinanoglu O, Almukhaizim S. Predictive analysis for projecting test compression levels. In Proceedings - International Test Conference 2010, ITC 2010. 2010. 5699228 https://doi.org/10.1109/TEST.2010.5699228
    Sinanoglu, Ozgur ; Almukhaizim, Sobeeh. / Predictive analysis for projecting test compression levels. Proceedings - International Test Conference 2010, ITC 2010. 2010.
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