Predicted carbon-cluster field evaporation from graphite by pulsed-field STM

X. H. Wu, E. L. Wolf

Research output: Contribution to journalArticle

Abstract

Field evaporation of carbon as positive and negative ions from the clean graphite (001) plane surface under STM pulsed-field conditions has been investigated. We use the charge-exchange model, taking the potential from a simple empirical atomic potential model. The removed carbon atom considered here initially resides in the perfect graphite surface, rather than being an adsorbed atom. Assuming a clean tungsten tip as counterelectrode, threshold electric fields for C-, C+, and C2+ have been obtained. We further consider the possibility of field evaporation of C clusters. Our calculations indicate that C atoms can field-evaporate as members of ionic clusters at much lower threshold fields than a single carbon atom can. We conclude that ionic carbon clusters are favored in field evaporation from graphite, based on lower threshold fields obtained in the charge-exchange model.

Original languageEnglish (US)
Pages (from-to)353-359
Number of pages7
JournalSurface Science
Volume366
Issue number2
DOIs
StatePublished - Oct 20 1996

Fingerprint

Carbon clusters
Graphite
Evaporation
graphite
evaporation
Atoms
Carbon
carbon
charge exchange
thresholds
atoms
Tungsten
positive ions
negative ions
adatoms
tungsten
Negative ions
Positive ions
Electric fields
electric fields

Keywords

  • Carbon clusters
  • Field evaporation
  • Graphite
  • Scanning tunneling microscopy

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Predicted carbon-cluster field evaporation from graphite by pulsed-field STM. / Wu, X. H.; Wolf, E. L.

In: Surface Science, Vol. 366, No. 2, 20.10.1996, p. 353-359.

Research output: Contribution to journalArticle

Wu, X. H. ; Wolf, E. L. / Predicted carbon-cluster field evaporation from graphite by pulsed-field STM. In: Surface Science. 1996 ; Vol. 366, No. 2. pp. 353-359.
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