Polarized Raman study on the lattice structure of BiFeO3 films prepared by pulsed laser deposition

Y. Yang, Y. B. Yao, Q. Zhang, X. X. Zhang

Research output: Contribution to journalArticle

Abstract

Polarized Raman spectroscopy was used to study the lattice structure of BiFeO3 films on different substrates prepared by pulsed laser deposition. Interestingly, the Raman spectra of BiFeO3 films exhibit distinct polarization dependences. The symmetries of the fundamental Raman modes in 50-700 cm-1 were identified based on group theory. The symmetries of the high order Raman modes in 900-1500 cm-1 of BiFeO3 are determined for the first time, which can provide strong clarifications to the symmetry of the fundamental peaks in 400-700 cm-1 in return. Moreover, the lattice structures of BiFeO3 films are identified consequently on the basis of Raman spectroscopy. BiFeO3 films on SrRuO3 coated SrTiO3 (0 0 1) substrate, CaRuO3 coated SrTiO3 (0 0 1) substrate and tin-doped indium oxide substrate are found to be in the rhombohedral structure, while BiFeO3 film on SrRuO3 coated Nb: SrTiO3 (0 0 1) substrate is in the monoclinic structure. Our results suggest that polarized Raman spectroscopy would be a feasible tool to study the lattice structure of BiFeO3 films.

Original languageEnglish (US)
Pages (from-to)101-106
Number of pages6
JournalVibrational spectroscopy
Volume75
DOIs
StatePublished - Nov 2014

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Keywords

  • BiFeO films
  • Polarized Raman spectroscopy
  • Pulsed laser deposition
  • Substrates

ASJC Scopus subject areas

  • Spectroscopy

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