Plastic deformation of pentagonal silver nanowires: Comparison between AFM nanoindentation and atomistic simulations

Marcel Lucas, Austin M. Leach, Matthew T. McDowell, Simona E. Hunyadi, Ken Gall, Catherine J. Murphy, Elisa Riedo

Research output: Contribution to journalArticle

Abstract

The plastic deformation of a pentagonal silver nanowire is studied by nanoindentation using an atomic force microscope (AFM). AFM images of the residual indent reveal the formation of a neck and surface atomic steps. To study the microscopic deformation mechanism, the indentation force-depth curve is converted to an indentation stress-strain curve and compared to the tensile stress-strain curves predicted by the atomistic simulations of pentagonal silver nanowires. The indentation stress-strain curve exhibits a series of yielding events, attributed to the nucleation and movement of dislocations. The maximum stress measured during nanoindentation (2 GPa) is comparable to the tensile yield strength predicted by atomistic simulations.

Original languageEnglish (US)
Article number245420
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume77
Issue number24
DOIs
StatePublished - Jun 13 2008

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Nanoindentation
Stress-strain curves
nanoindentation
Silver
Indentation
plastic deformation
Nanowires
Plastic deformation
Microscopes
nanowires
indentation
microscopes
silver
curves
simulation
Tensile stress
Yield stress
Nucleation
yield strength
tensile stress

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Plastic deformation of pentagonal silver nanowires : Comparison between AFM nanoindentation and atomistic simulations. / Lucas, Marcel; Leach, Austin M.; McDowell, Matthew T.; Hunyadi, Simona E.; Gall, Ken; Murphy, Catherine J.; Riedo, Elisa.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 77, No. 24, 245420, 13.06.2008.

Research output: Contribution to journalArticle

Lucas, Marcel ; Leach, Austin M. ; McDowell, Matthew T. ; Hunyadi, Simona E. ; Gall, Ken ; Murphy, Catherine J. ; Riedo, Elisa. / Plastic deformation of pentagonal silver nanowires : Comparison between AFM nanoindentation and atomistic simulations. In: Physical Review B - Condensed Matter and Materials Physics. 2008 ; Vol. 77, No. 24.
@article{a645070568a148dc8366ee6a0c7282da,
title = "Plastic deformation of pentagonal silver nanowires: Comparison between AFM nanoindentation and atomistic simulations",
abstract = "The plastic deformation of a pentagonal silver nanowire is studied by nanoindentation using an atomic force microscope (AFM). AFM images of the residual indent reveal the formation of a neck and surface atomic steps. To study the microscopic deformation mechanism, the indentation force-depth curve is converted to an indentation stress-strain curve and compared to the tensile stress-strain curves predicted by the atomistic simulations of pentagonal silver nanowires. The indentation stress-strain curve exhibits a series of yielding events, attributed to the nucleation and movement of dislocations. The maximum stress measured during nanoindentation (2 GPa) is comparable to the tensile yield strength predicted by atomistic simulations.",
author = "Marcel Lucas and Leach, {Austin M.} and McDowell, {Matthew T.} and Hunyadi, {Simona E.} and Ken Gall and Murphy, {Catherine J.} and Elisa Riedo",
year = "2008",
month = "6",
day = "13",
doi = "10.1103/PhysRevB.77.245420",
language = "English (US)",
volume = "77",
journal = "Physical Review B-Condensed Matter",
issn = "1098-0121",
publisher = "American Physical Society",
number = "24",

}

TY - JOUR

T1 - Plastic deformation of pentagonal silver nanowires

T2 - Comparison between AFM nanoindentation and atomistic simulations

AU - Lucas, Marcel

AU - Leach, Austin M.

AU - McDowell, Matthew T.

AU - Hunyadi, Simona E.

AU - Gall, Ken

AU - Murphy, Catherine J.

AU - Riedo, Elisa

PY - 2008/6/13

Y1 - 2008/6/13

N2 - The plastic deformation of a pentagonal silver nanowire is studied by nanoindentation using an atomic force microscope (AFM). AFM images of the residual indent reveal the formation of a neck and surface atomic steps. To study the microscopic deformation mechanism, the indentation force-depth curve is converted to an indentation stress-strain curve and compared to the tensile stress-strain curves predicted by the atomistic simulations of pentagonal silver nanowires. The indentation stress-strain curve exhibits a series of yielding events, attributed to the nucleation and movement of dislocations. The maximum stress measured during nanoindentation (2 GPa) is comparable to the tensile yield strength predicted by atomistic simulations.

AB - The plastic deformation of a pentagonal silver nanowire is studied by nanoindentation using an atomic force microscope (AFM). AFM images of the residual indent reveal the formation of a neck and surface atomic steps. To study the microscopic deformation mechanism, the indentation force-depth curve is converted to an indentation stress-strain curve and compared to the tensile stress-strain curves predicted by the atomistic simulations of pentagonal silver nanowires. The indentation stress-strain curve exhibits a series of yielding events, attributed to the nucleation and movement of dislocations. The maximum stress measured during nanoindentation (2 GPa) is comparable to the tensile yield strength predicted by atomistic simulations.

UR - http://www.scopus.com/inward/record.url?scp=45349093263&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=45349093263&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.77.245420

DO - 10.1103/PhysRevB.77.245420

M3 - Article

VL - 77

JO - Physical Review B-Condensed Matter

JF - Physical Review B-Condensed Matter

SN - 1098-0121

IS - 24

M1 - 245420

ER -