Piezo-PUF

Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS

Alabi Bojesomo, Ibrahim Abe M. Elfadel, Ozgur Sinanoglu

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    The cyber and hardware security of constrained edge nodes have become a paramount requirement for the ultimate success of the Internet of Things (IoT). Such security needs to be guaranteed at minimum impact on energy efficiency and autonomy. One important approach to IoT energy autonmoy is the use of energy harvesters. In this paper, we select MEMS piezolelectric energy harvesters to propose a physically unclonable function (Piezo-PUF) which relies on the manufacturing uncertainties of the MEMS fabrication process. The major result of this paper is that several of the MEMS manufacturing uncertainties cannot be easily cloned, which leads to various mechanical and electrical features that can be leveraged for generating cryptographic keys. Thorough security analysis of Piezo-PUF has been conducted using wafer-level simulations and measurements. The security analysis confirms that Piezo-PUF qualifies as weak PUF for secure key generation and authentication.

    Original languageEnglish (US)
    Title of host publication2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9781728132860
    DOIs
    StatePublished - May 1 2019
    Event2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019 - Paris, France
    Duration: May 12 2019May 15 2019

    Publication series

    Name2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019

    Conference

    Conference2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019
    CountryFrance
    CityParis
    Period5/12/195/15/19

    Fingerprint

    MEMS
    Harvesters
    Vacuum
    Authentication
    Energy efficiency
    Fabrication
    Hardware security
    Uncertainty
    Internet of things

    ASJC Scopus subject areas

    • Safety, Risk, Reliability and Quality
    • Electrical and Electronic Engineering
    • Mechanical Engineering

    Cite this

    Bojesomo, A., Elfadel, I. A. M., & Sinanoglu, O. (2019). Piezo-PUF: Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS. In 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019 [8752778] (2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DTIP.2019.8752778

    Piezo-PUF : Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS. / Bojesomo, Alabi; Elfadel, Ibrahim Abe M.; Sinanoglu, Ozgur.

    2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019. Institute of Electrical and Electronics Engineers Inc., 2019. 8752778 (2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Bojesomo, A, Elfadel, IAM & Sinanoglu, O 2019, Piezo-PUF: Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS. in 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019., 8752778, 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019, Institute of Electrical and Electronics Engineers Inc., 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019, Paris, France, 5/12/19. https://doi.org/10.1109/DTIP.2019.8752778
    Bojesomo A, Elfadel IAM, Sinanoglu O. Piezo-PUF: Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS. In 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019. Institute of Electrical and Electronics Engineers Inc. 2019. 8752778. (2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019). https://doi.org/10.1109/DTIP.2019.8752778
    Bojesomo, Alabi ; Elfadel, Ibrahim Abe M. ; Sinanoglu, Ozgur. / Piezo-PUF : Physical Unclonable Functions for Vacuum-Packaged, Piezoelectric MEMS. 2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019. Institute of Electrical and Electronics Engineers Inc., 2019. (2019 Symposium on Design, Test, Integration and Packaging of MEMS and MOEMS, DTIP 2019).
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    abstract = "The cyber and hardware security of constrained edge nodes have become a paramount requirement for the ultimate success of the Internet of Things (IoT). Such security needs to be guaranteed at minimum impact on energy efficiency and autonomy. One important approach to IoT energy autonmoy is the use of energy harvesters. In this paper, we select MEMS piezolelectric energy harvesters to propose a physically unclonable function (Piezo-PUF) which relies on the manufacturing uncertainties of the MEMS fabrication process. The major result of this paper is that several of the MEMS manufacturing uncertainties cannot be easily cloned, which leads to various mechanical and electrical features that can be leveraged for generating cryptographic keys. Thorough security analysis of Piezo-PUF has been conducted using wafer-level simulations and measurements. The security analysis confirms that Piezo-PUF qualifies as weak PUF for secure key generation and authentication.",
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