Perpendicular magnetic anisotropy in ultrathin Co | Ni multilayer films studied with ferromagnetic resonance and magnetic x-ray microspectroscopy

F. MacIà, P. Warnicke, D. Bedau, M. Y. Im, P. Fischer, D. A. Arena, A. D. Kent

    Research output: Contribution to journalArticle

    Abstract

    Ferromagnetic resonance (FMR) spectroscopy, x-ray magnetic circular dichroism (XMCD) spectroscopy and magnetic transmission soft x-ray microscopy (MTXM) experiments have been performed to gain insight into the magnetic anisotropy and domain structure of ultrathin Co|Ni multilayer films with a thin permalloy layer underneath. MTXM images with a spatial resolution better than 25 nm were obtained at the Co L 3 edge down to an equivalent thickness of Co of only 1 nm, which establishes a new lower boundary on the sensitivity limit of MTXM. Domain sizes are shown to be strong functions of the anisotropy and thickness of the film.

    Original languageEnglish (US)
    Pages (from-to)3629-3632
    Number of pages4
    JournalJournal of Magnetism and Magnetic Materials
    Volume324
    Issue number22
    DOIs
    StatePublished - Nov 2012

    Fingerprint

    Ferromagnetic resonance
    Magnetic anisotropy
    Multilayer films
    ferromagnetic resonance
    microscopy
    X rays
    Microscopic examination
    anisotropy
    x rays
    Permalloys (trademark)
    Circular dichroism spectroscopy
    Magnetic domains
    x ray spectroscopy
    dichroism
    spatial resolution
    Anisotropy
    sensitivity
    Spectroscopy
    spectroscopy
    Experiments

    Keywords

    • Domain imaging
    • Ferromagnetic resonance (FMR)
    • Perpendicular magnetic anisotropy
    • X-ray magnetic circular dichorism
    • X-ray microscopy

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Electronic, Optical and Magnetic Materials

    Cite this

    Perpendicular magnetic anisotropy in ultrathin Co | Ni multilayer films studied with ferromagnetic resonance and magnetic x-ray microspectroscopy. / MacIà, F.; Warnicke, P.; Bedau, D.; Im, M. Y.; Fischer, P.; Arena, D. A.; Kent, A. D.

    In: Journal of Magnetism and Magnetic Materials, Vol. 324, No. 22, 11.2012, p. 3629-3632.

    Research output: Contribution to journalArticle

    MacIà, F. ; Warnicke, P. ; Bedau, D. ; Im, M. Y. ; Fischer, P. ; Arena, D. A. ; Kent, A. D. / Perpendicular magnetic anisotropy in ultrathin Co | Ni multilayer films studied with ferromagnetic resonance and magnetic x-ray microspectroscopy. In: Journal of Magnetism and Magnetic Materials. 2012 ; Vol. 324, No. 22. pp. 3629-3632.
    @article{112fa4a328a442b9ac71c3e4b69255cd,
    title = "Perpendicular magnetic anisotropy in ultrathin Co | Ni multilayer films studied with ferromagnetic resonance and magnetic x-ray microspectroscopy",
    abstract = "Ferromagnetic resonance (FMR) spectroscopy, x-ray magnetic circular dichroism (XMCD) spectroscopy and magnetic transmission soft x-ray microscopy (MTXM) experiments have been performed to gain insight into the magnetic anisotropy and domain structure of ultrathin Co|Ni multilayer films with a thin permalloy layer underneath. MTXM images with a spatial resolution better than 25 nm were obtained at the Co L 3 edge down to an equivalent thickness of Co of only 1 nm, which establishes a new lower boundary on the sensitivity limit of MTXM. Domain sizes are shown to be strong functions of the anisotropy and thickness of the film.",
    keywords = "Domain imaging, Ferromagnetic resonance (FMR), Perpendicular magnetic anisotropy, X-ray magnetic circular dichorism, X-ray microscopy",
    author = "F. MacI{\`a} and P. Warnicke and D. Bedau and Im, {M. Y.} and P. Fischer and Arena, {D. A.} and Kent, {A. D.}",
    year = "2012",
    month = "11",
    doi = "10.1016/j.jmmm.2012.03.063",
    language = "English (US)",
    volume = "324",
    pages = "3629--3632",
    journal = "Journal of Magnetism and Magnetic Materials",
    issn = "0304-8853",
    publisher = "Elsevier",
    number = "22",

    }

    TY - JOUR

    T1 - Perpendicular magnetic anisotropy in ultrathin Co | Ni multilayer films studied with ferromagnetic resonance and magnetic x-ray microspectroscopy

    AU - MacIà, F.

    AU - Warnicke, P.

    AU - Bedau, D.

    AU - Im, M. Y.

    AU - Fischer, P.

    AU - Arena, D. A.

    AU - Kent, A. D.

    PY - 2012/11

    Y1 - 2012/11

    N2 - Ferromagnetic resonance (FMR) spectroscopy, x-ray magnetic circular dichroism (XMCD) spectroscopy and magnetic transmission soft x-ray microscopy (MTXM) experiments have been performed to gain insight into the magnetic anisotropy and domain structure of ultrathin Co|Ni multilayer films with a thin permalloy layer underneath. MTXM images with a spatial resolution better than 25 nm were obtained at the Co L 3 edge down to an equivalent thickness of Co of only 1 nm, which establishes a new lower boundary on the sensitivity limit of MTXM. Domain sizes are shown to be strong functions of the anisotropy and thickness of the film.

    AB - Ferromagnetic resonance (FMR) spectroscopy, x-ray magnetic circular dichroism (XMCD) spectroscopy and magnetic transmission soft x-ray microscopy (MTXM) experiments have been performed to gain insight into the magnetic anisotropy and domain structure of ultrathin Co|Ni multilayer films with a thin permalloy layer underneath. MTXM images with a spatial resolution better than 25 nm were obtained at the Co L 3 edge down to an equivalent thickness of Co of only 1 nm, which establishes a new lower boundary on the sensitivity limit of MTXM. Domain sizes are shown to be strong functions of the anisotropy and thickness of the film.

    KW - Domain imaging

    KW - Ferromagnetic resonance (FMR)

    KW - Perpendicular magnetic anisotropy

    KW - X-ray magnetic circular dichorism

    KW - X-ray microscopy

    UR - http://www.scopus.com/inward/record.url?scp=84864754581&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=84864754581&partnerID=8YFLogxK

    U2 - 10.1016/j.jmmm.2012.03.063

    DO - 10.1016/j.jmmm.2012.03.063

    M3 - Article

    VL - 324

    SP - 3629

    EP - 3632

    JO - Journal of Magnetism and Magnetic Materials

    JF - Journal of Magnetism and Magnetic Materials

    SN - 0304-8853

    IS - 22

    ER -