Peak power reduction through dynamic partitioning of scan chains

Sobeeh Almukhaizim, Ozgur Sinanoglu

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Serial shift operations in scan-based testing impose elevated levels ofpower dissipation, endangering the reliability of the chip being tested. Scan chain partitioning techniques are quite effective in reducing test power, as the rippling in the clock network, in the scan chains, and in the combination logic is reduced altogether Partitioning approaches implemented in a static manner may fail to reduce peak power down to the desired level, however, depending on the transition distribution of the problematic pattern in the statically constructed scan chain partitions. In this paper, we propose a dynamic partitioning approach capable of adapting to the transition distribution of any test pattern, and thus of delivering near-perfect peak power reductions. Weformulate the scan chain partitioningproblem via Integer Linear Programming (ILP) and also propose an efficient greedy heuristic. The proposedpartitioning hardware allowsfor the partitioning reconfiguration on a per test pattern basis, enabling the dynamic partitioning. Significant peakpower reductionsare thus attained cost-effectively.

    Original languageEnglish (US)
    Title of host publicationProceedings - International Test Conference 2008, ITC 2008
    DOIs
    StatePublished - Dec 1 2008
    EventInternational Test Conference 2008, ITC 2008 - Santa Clara, CA, United States
    Duration: Oct 28 2008Oct 30 2008

    Other

    OtherInternational Test Conference 2008, ITC 2008
    CountryUnited States
    CitySanta Clara, CA
    Period10/28/0810/30/08

    Fingerprint

    Partitioning
    Linear programming
    Clocks
    Hardware
    Testing
    Greedy Heuristics
    Integer Linear Programming
    Costs
    Reconfiguration
    Dissipation
    Chip
    Partition
    Logic

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Applied Mathematics

    Cite this

    Almukhaizim, S., & Sinanoglu, O. (2008). Peak power reduction through dynamic partitioning of scan chains. In Proceedings - International Test Conference 2008, ITC 2008 [4700573] https://doi.org/10.1109/TEST.2008.4700573

    Peak power reduction through dynamic partitioning of scan chains. / Almukhaizim, Sobeeh; Sinanoglu, Ozgur.

    Proceedings - International Test Conference 2008, ITC 2008. 2008. 4700573.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Almukhaizim, S & Sinanoglu, O 2008, Peak power reduction through dynamic partitioning of scan chains. in Proceedings - International Test Conference 2008, ITC 2008., 4700573, International Test Conference 2008, ITC 2008, Santa Clara, CA, United States, 10/28/08. https://doi.org/10.1109/TEST.2008.4700573
    Almukhaizim S, Sinanoglu O. Peak power reduction through dynamic partitioning of scan chains. In Proceedings - International Test Conference 2008, ITC 2008. 2008. 4700573 https://doi.org/10.1109/TEST.2008.4700573
    Almukhaizim, Sobeeh ; Sinanoglu, Ozgur. / Peak power reduction through dynamic partitioning of scan chains. Proceedings - International Test Conference 2008, ITC 2008. 2008.
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