Parameterized VHDL library for on-line testing

C. Stroud, M. Ding, S. Seshadri, I. Kim, S. Roy, S. Wu, R. Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We describe a library of parameterized VHDL models for various concurrent fault detection circuits and maintenance functions developed for simulation and synthesis of ASICs which support on-line testing and diagnostics in systems designed for high reliability and availability. Issues associated with the selection and modeling of the various online testing functions are also discussed.

Original languageEnglish (US)
Title of host publicationIEEE International Test Conference (TC)
Editors Anon
PublisherIEEE
Pages479-488
Number of pages10
StatePublished - 1997
EventProceedings of the 1997 IEEE International Test Conference - Washington, DC, USA
Duration: Nov 3 1997Nov 5 1997

Other

OtherProceedings of the 1997 IEEE International Test Conference
CityWashington, DC, USA
Period11/3/9711/5/97

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Stroud, C., Ding, M., Seshadri, S., Kim, I., Roy, S., Wu, S., & Karri, R. (1997). Parameterized VHDL library for on-line testing. In Anon (Ed.), IEEE International Test Conference (TC) (pp. 479-488). IEEE.