Orientation imaging microscopy in two-dimensional crystals via undersampled microscopy

D. E. Angelescu, C. K. Harrison, M. L. Trawick, P. M. Chaikin, R. A. Register, D. H. Adamson

    Research output: Contribution to journalArticle

    Abstract

    A novel microscopy analysis technique is presented, with applications in imaging two-dimensional grains and grain boundaries. The method allows the identification of grain shapes and orientations from large area micrographs, via the moire pattern obtained in a raster image. The observed moire pattern originates from the aliasing between a micrograph's regular sampling raster and the inherent periodicity of the elements forming the grain under study. The technique presented is very general, allowing grain analysis via many types of microscopy. We demonstrate it in this paper by using Tapping Mode Atomic Force Microscopy and Scanning Electron Microscopy on diblock copolymer thin films.

    Original languageEnglish (US)
    Pages (from-to)387-392
    Number of pages6
    JournalApplied Physics A: Materials Science and Processing
    Volume78
    Issue number3
    DOIs
    StatePublished - Feb 2004

    Fingerprint

    Crystal orientation
    Microscopic examination
    microscopy
    Imaging techniques
    Crystals
    crystals
    Block copolymers
    periodic variations
    Atomic force microscopy
    copolymers
    Grain boundaries
    grain boundaries
    sampling
    atomic force microscopy
    Sampling
    Thin films
    Scanning electron microscopy
    scanning electron microscopy
    thin films

    ASJC Scopus subject areas

    • Materials Science(all)
    • Physics and Astronomy (miscellaneous)

    Cite this

    Angelescu, D. E., Harrison, C. K., Trawick, M. L., Chaikin, P. M., Register, R. A., & Adamson, D. H. (2004). Orientation imaging microscopy in two-dimensional crystals via undersampled microscopy. Applied Physics A: Materials Science and Processing, 78(3), 387-392. https://doi.org/10.1007/s00339-002-2012-5

    Orientation imaging microscopy in two-dimensional crystals via undersampled microscopy. / Angelescu, D. E.; Harrison, C. K.; Trawick, M. L.; Chaikin, P. M.; Register, R. A.; Adamson, D. H.

    In: Applied Physics A: Materials Science and Processing, Vol. 78, No. 3, 02.2004, p. 387-392.

    Research output: Contribution to journalArticle

    Angelescu, DE, Harrison, CK, Trawick, ML, Chaikin, PM, Register, RA & Adamson, DH 2004, 'Orientation imaging microscopy in two-dimensional crystals via undersampled microscopy', Applied Physics A: Materials Science and Processing, vol. 78, no. 3, pp. 387-392. https://doi.org/10.1007/s00339-002-2012-5
    Angelescu, D. E. ; Harrison, C. K. ; Trawick, M. L. ; Chaikin, P. M. ; Register, R. A. ; Adamson, D. H. / Orientation imaging microscopy in two-dimensional crystals via undersampled microscopy. In: Applied Physics A: Materials Science and Processing. 2004 ; Vol. 78, No. 3. pp. 387-392.
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