A novel microscopy analysis technique is presented, with applications in imaging two-dimensional grains and grain boundaries. The method allows the identification of grain shapes and orientations from large area micrographs, via the moire pattern obtained in a raster image. The observed moire pattern originates from the aliasing between a micrograph's regular sampling raster and the inherent periodicity of the elements forming the grain under study. The technique presented is very general, allowing grain analysis via many types of microscopy. We demonstrate it in this paper by using Tapping Mode Atomic Force Microscopy and Scanning Electron Microscopy on diblock copolymer thin films.
|Original language||English (US)|
|Number of pages||6|
|Journal||Applied Physics A: Materials Science and Processing|
|State||Published - Feb 1 2004|
ASJC Scopus subject areas
- Materials Science(all)