On the impact of manufacturing process variations on the lifetime of sensor networks

Siddharth Garg, Diana Marculescu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

As an emerging technology, sensor networks provide the ability to accurately monitor the characteristics of wide geographical areas over long periods of time. The lifetime of individual nodes in a sensor network depends strongly on the leakage power that the nodes dissipate in the idle state, especially for low-throughput applications. With the introduction of advanced low power design techniques, such as sub-threshold voltage design styles, and the migration of fabrication processes to smaller technology generations, variability in leakage power dissipation of the sensor nodes will lead to increased variability in their lifetimes. In this paper, we analyze how this increased variability in the lifetime of individual sensor nodes affects the performance and lifetime of the network as a whole. We demonstrate how sensor network designers can use the proposed analysis framework to trade-off the cost of a sensor network deployment with the performance it offers. Our results indicate that up to 37% improvement in the critical lifetime of a sensor network (defined as the expected time at which the sensor network becomes disconnected) can be obtained over a baseline design with a 20% increase in the cost of the individual sensor nodes.

Original languageEnglish (US)
Title of host publicationCODES+ISSS 2007: International Conference on Hardware/Software Codesign and System Synthesis
Pages203-208
Number of pages6
DOIs
StatePublished - 2007
EventCODES+ISSS 2007: 5th International Conference on Hardware/Software Codesign and System Synthesis - Salzburg, Austria
Duration: Sep 30 2007Oct 3 2007

Other

OtherCODES+ISSS 2007: 5th International Conference on Hardware/Software Codesign and System Synthesis
CountryAustria
CitySalzburg
Period9/30/0710/3/07

Fingerprint

Sensor networks
Sensor nodes
Threshold voltage
Costs
Energy dissipation
Throughput
Fabrication

Keywords

  • Leakage power variability
  • Lifetime
  • Manufacturing process variations
  • Sensor networks

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Hardware and Architecture
  • Software

Cite this

Garg, S., & Marculescu, D. (2007). On the impact of manufacturing process variations on the lifetime of sensor networks. In CODES+ISSS 2007: International Conference on Hardware/Software Codesign and System Synthesis (pp. 203-208) https://doi.org/10.1145/1289816.1289866

On the impact of manufacturing process variations on the lifetime of sensor networks. / Garg, Siddharth; Marculescu, Diana.

CODES+ISSS 2007: International Conference on Hardware/Software Codesign and System Synthesis. 2007. p. 203-208.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Garg, S & Marculescu, D 2007, On the impact of manufacturing process variations on the lifetime of sensor networks. in CODES+ISSS 2007: International Conference on Hardware/Software Codesign and System Synthesis. pp. 203-208, CODES+ISSS 2007: 5th International Conference on Hardware/Software Codesign and System Synthesis, Salzburg, Austria, 9/30/07. https://doi.org/10.1145/1289816.1289866
Garg S, Marculescu D. On the impact of manufacturing process variations on the lifetime of sensor networks. In CODES+ISSS 2007: International Conference on Hardware/Software Codesign and System Synthesis. 2007. p. 203-208 https://doi.org/10.1145/1289816.1289866
Garg, Siddharth ; Marculescu, Diana. / On the impact of manufacturing process variations on the lifetime of sensor networks. CODES+ISSS 2007: International Conference on Hardware/Software Codesign and System Synthesis. 2007. pp. 203-208
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