On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors

Naghmeh Karimiy, Mihalis Maniatakos, Abhijit Jas, Yiorgos Makris

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    We investigate the correlation between register transfer-level faults in the control logic of a modern microprocessor and their instruction-level impact on the execution flow of typical programs. Such information can prove immensely useful in accurately assessing and prioritizing faults with regards to their criticality, as well as commensurately allocating resources to enhance testability, diagnosability, manufacturability and reliability. To this end, we developed an extensive infrastructure which allows injection of stuck-at faults and transient errors of arbitrary starting point and duration, as well as cost-effective simulation and classification of their repercussions into various instruction-level error types. As a test vehicle for our study, we employ a superscalar, dynamically-scheduled, out-of-order, Alpha-like microprocessor, on which we execute SPEC2000 integer benchmarks. Extensive experimentation with faults injected in control logic modules of this microprocessor reveals interesting trends and results, corroborating the utility of this simulation infrastructure and motivating its further development and application to various tasks related to robust design.

    Original languageEnglish (US)
    Title of host publicationProceedings - International Test Conference 2008, ITC 2008
    DOIs
    StatePublished - Dec 1 2008
    EventInternational Test Conference 2008, ITC 2008 - Santa Clara, CA, United States
    Duration: Oct 28 2008Oct 30 2008

    Other

    OtherInternational Test Conference 2008, ITC 2008
    CountryUnited States
    CitySanta Clara, CA
    Period10/28/0810/30/08

    Fingerprint

    Microprocessor
    Microprocessor chips
    Fault
    Controller
    Controllers
    Infrastructure
    Logic
    Diagnosability
    Superscalar
    Robust Design
    Criticality
    Experimentation
    Injection
    Simulation
    Benchmark
    Module
    Resources
    Integer
    Costs
    Arbitrary

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Applied Mathematics

    Cite this

    Karimiy, N., Maniatakos, M., Jas, A., & Makris, Y. (2008). On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. In Proceedings - International Test Conference 2008, ITC 2008 [4700613] https://doi.org/10.1109/TEST.2008.4700613

    On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. / Karimiy, Naghmeh; Maniatakos, Mihalis; Jas, Abhijit; Makris, Yiorgos.

    Proceedings - International Test Conference 2008, ITC 2008. 2008. 4700613.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Karimiy, N, Maniatakos, M, Jas, A & Makris, Y 2008, On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. in Proceedings - International Test Conference 2008, ITC 2008., 4700613, International Test Conference 2008, ITC 2008, Santa Clara, CA, United States, 10/28/08. https://doi.org/10.1109/TEST.2008.4700613
    Karimiy N, Maniatakos M, Jas A, Makris Y. On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. In Proceedings - International Test Conference 2008, ITC 2008. 2008. 4700613 https://doi.org/10.1109/TEST.2008.4700613
    Karimiy, Naghmeh ; Maniatakos, Mihalis ; Jas, Abhijit ; Makris, Yiorgos. / On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. Proceedings - International Test Conference 2008, ITC 2008. 2008.
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