On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors

Naghmeh Karimiy, Mihalis Maniatakos, Abhijit Jas, Yiorgos Makris

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigate the correlation between register transfer-level faults in the control logic of a modern microprocessor and their instruction-level impact on the execution flow of typical programs. Such information can prove immensely useful in accurately assessing and prioritizing faults with regards to their criticality, as well as commensurately allocating resources to enhance testability, diagnosability, manufacturability and reliability. To this end, we developed an extensive infrastructure which allows injection of stuck-at faults and transient errors of arbitrary starting point and duration, as well as cost-effective simulation and classification of their repercussions into various instruction-level error types. As a test vehicle for our study, we employ a superscalar, dynamically-scheduled, out-of-order, Alpha-like microprocessor, on which we execute SPEC2000 integer benchmarks. Extensive experimentation with faults injected in control logic modules of this microprocessor reveals interesting trends and results, corroborating the utility of this simulation infrastructure and motivating its further development and application to various tasks related to robust design.

Original languageEnglish (US)
Title of host publicationProceedings - International Test Conference 2008, ITC 2008
DOIs
StatePublished - Dec 1 2008
EventInternational Test Conference 2008, ITC 2008 - Santa Clara, CA, United States
Duration: Oct 28 2008Oct 30 2008

Other

OtherInternational Test Conference 2008, ITC 2008
CountryUnited States
CitySanta Clara, CA
Period10/28/0810/30/08

Fingerprint

Microprocessor
Microprocessor chips
Fault
Controller
Controllers
Infrastructure
Logic
Diagnosability
Superscalar
Robust Design
Criticality
Experimentation
Injection
Simulation
Benchmark
Module
Resources
Integer
Costs
Arbitrary

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

Karimiy, N., Maniatakos, M., Jas, A., & Makris, Y. (2008). On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. In Proceedings - International Test Conference 2008, ITC 2008 [4700613] https://doi.org/10.1109/TEST.2008.4700613

On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. / Karimiy, Naghmeh; Maniatakos, Mihalis; Jas, Abhijit; Makris, Yiorgos.

Proceedings - International Test Conference 2008, ITC 2008. 2008. 4700613.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Karimiy, N, Maniatakos, M, Jas, A & Makris, Y 2008, On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. in Proceedings - International Test Conference 2008, ITC 2008., 4700613, International Test Conference 2008, ITC 2008, Santa Clara, CA, United States, 10/28/08. https://doi.org/10.1109/TEST.2008.4700613
Karimiy N, Maniatakos M, Jas A, Makris Y. On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. In Proceedings - International Test Conference 2008, ITC 2008. 2008. 4700613 https://doi.org/10.1109/TEST.2008.4700613
Karimiy, Naghmeh ; Maniatakos, Mihalis ; Jas, Abhijit ; Makris, Yiorgos. / On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. Proceedings - International Test Conference 2008, ITC 2008. 2008.
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