Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing

Christian Russ, Karlheinz Bock, Mahmoud Rasras, Ingrid De Wolf, Guido Groeseneken, Herman E. Maes

Research output: Contribution to journalConference article

Abstract

The triggering of gg-nMOS and field-oxide devices, essential for optimized protection design, is addressed fly TLP-pulsed emission microscopy. Current non-uniformity and instability effects in snapback operation under DC and TLP conditions are demonstrated. The comprehensive correlation of emission and electrical behavior allows an improved interpretation of device operation. Technological influences on the trigger uniformity are discussed.

Original languageEnglish (US)
Pages (from-to)177-186
Number of pages10
JournalElectrical Overstress/Electrostatic Discharge Symposium Proceedings
StatePublished - Dec 1 1998
EventProceedings of the 1998 20th Annual International EOS/ESD Symposium - Reno, NV, USA
Duration: Oct 6 1998Oct 8 1998

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ASJC Scopus subject areas

  • Condensed Matter Physics

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