Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing

Christian Russ, Karlheinz Bock, Mahmoud Rasras, Ingrid De Wolf, Guido Groeseneken, Herman E. Maes

    Research output: Contribution to journalConference article

    Abstract

    The triggering of gg-nMOS and field-oxide devices, essential for optimized protection design, is addressed fly TLP-pulsed emission microscopy. Current non-uniformity and instability effects in snapback operation under DC and TLP conditions are demonstrated. The comprehensive correlation of emission and electrical behavior allows an improved interpretation of device operation. Technological influences on the trigger uniformity are discussed.

    Original languageEnglish (US)
    Pages (from-to)177-186
    Number of pages10
    JournalElectrical Overstress/Electrostatic Discharge Symposium Proceedings
    StatePublished - Dec 1 1998
    EventProceedings of the 1998 20th Annual International EOS/ESD Symposium - Reno, NV, USA
    Duration: Oct 6 1998Oct 8 1998

    Fingerprint

    transmission lines
    microscopy
    nonuniformity
    actuators
    direct current
    oxides

    ASJC Scopus subject areas

    • Condensed Matter Physics

    Cite this

    Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing. / Russ, Christian; Bock, Karlheinz; Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman E.

    In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 01.12.1998, p. 177-186.

    Research output: Contribution to journalConference article

    Russ, Christian ; Bock, Karlheinz ; Rasras, Mahmoud ; De Wolf, Ingrid ; Groeseneken, Guido ; Maes, Herman E. / Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing. In: Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1998 ; pp. 177-186.
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    AU - Groeseneken, Guido

    AU - Maes, Herman E.

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