Nanorheology by atomic force microscopy

Tai De Li, Hsiang Chih Chiu, Deborah Ortiz-Young, Elisa Riedo

Research output: Contribution to journalArticle

Abstract

We present an Atomic Force Microscopy (AFM) based method to investigate the rheological properties of liquids confined within a nanosize gap formed by an AFM tip apex and a solid substrate. In this method, a conventional AFM cantilever is sheared parallel to a substrate surface by means of a lock-in amplifier while it is approaching and retracting from the substrate in liquid. The normal solvation forces and lateral viscoelastic shear forces experienced by the AFM tip in liquid can be simultaneously measured as a function of the tip-substrate distance with sub-nanometer vertical resolution. A new calibration method is applied to compensate for the linear drift of the piezo transducer and substrate system, leading to a more precise determination of the tip-substrate distance. By monitoring the phase lag between the driving signal and the cantilever response in liquid, the frequency dependent viscoelastic properties of the confined liquid can also be derived. Finally, we discuss the results obtained with this technique from different liquid-solid interfaces. Namely, octamethylcyclotetrasiloxane and water on mica and highly oriented pyrolytic graphite.

Original languageEnglish (US)
Article number123707
JournalReview of Scientific Instruments
Volume85
Issue number12
DOIs
StatePublished - Dec 1 2014

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Atomic force microscopy
atomic force microscopy
Liquids
Substrates
liquids
pyrolytic graphite
Solvation
Mica
liquid-solid interfaces
mica
solvation
Transducers
transducers
apexes
Graphite
time lag
amplifiers
Calibration
shear
Monitoring

ASJC Scopus subject areas

  • Instrumentation

Cite this

Nanorheology by atomic force microscopy. / Li, Tai De; Chiu, Hsiang Chih; Ortiz-Young, Deborah; Riedo, Elisa.

In: Review of Scientific Instruments, Vol. 85, No. 12, 123707, 01.12.2014.

Research output: Contribution to journalArticle

Li, Tai De ; Chiu, Hsiang Chih ; Ortiz-Young, Deborah ; Riedo, Elisa. / Nanorheology by atomic force microscopy. In: Review of Scientific Instruments. 2014 ; Vol. 85, No. 12.
@article{1ca28084462c494ab8f7734889578402,
title = "Nanorheology by atomic force microscopy",
abstract = "We present an Atomic Force Microscopy (AFM) based method to investigate the rheological properties of liquids confined within a nanosize gap formed by an AFM tip apex and a solid substrate. In this method, a conventional AFM cantilever is sheared parallel to a substrate surface by means of a lock-in amplifier while it is approaching and retracting from the substrate in liquid. The normal solvation forces and lateral viscoelastic shear forces experienced by the AFM tip in liquid can be simultaneously measured as a function of the tip-substrate distance with sub-nanometer vertical resolution. A new calibration method is applied to compensate for the linear drift of the piezo transducer and substrate system, leading to a more precise determination of the tip-substrate distance. By monitoring the phase lag between the driving signal and the cantilever response in liquid, the frequency dependent viscoelastic properties of the confined liquid can also be derived. Finally, we discuss the results obtained with this technique from different liquid-solid interfaces. Namely, octamethylcyclotetrasiloxane and water on mica and highly oriented pyrolytic graphite.",
author = "Li, {Tai De} and Chiu, {Hsiang Chih} and Deborah Ortiz-Young and Elisa Riedo",
year = "2014",
month = "12",
day = "1",
doi = "10.1063/1.4903353",
language = "English (US)",
volume = "85",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "12",

}

TY - JOUR

T1 - Nanorheology by atomic force microscopy

AU - Li, Tai De

AU - Chiu, Hsiang Chih

AU - Ortiz-Young, Deborah

AU - Riedo, Elisa

PY - 2014/12/1

Y1 - 2014/12/1

N2 - We present an Atomic Force Microscopy (AFM) based method to investigate the rheological properties of liquids confined within a nanosize gap formed by an AFM tip apex and a solid substrate. In this method, a conventional AFM cantilever is sheared parallel to a substrate surface by means of a lock-in amplifier while it is approaching and retracting from the substrate in liquid. The normal solvation forces and lateral viscoelastic shear forces experienced by the AFM tip in liquid can be simultaneously measured as a function of the tip-substrate distance with sub-nanometer vertical resolution. A new calibration method is applied to compensate for the linear drift of the piezo transducer and substrate system, leading to a more precise determination of the tip-substrate distance. By monitoring the phase lag between the driving signal and the cantilever response in liquid, the frequency dependent viscoelastic properties of the confined liquid can also be derived. Finally, we discuss the results obtained with this technique from different liquid-solid interfaces. Namely, octamethylcyclotetrasiloxane and water on mica and highly oriented pyrolytic graphite.

AB - We present an Atomic Force Microscopy (AFM) based method to investigate the rheological properties of liquids confined within a nanosize gap formed by an AFM tip apex and a solid substrate. In this method, a conventional AFM cantilever is sheared parallel to a substrate surface by means of a lock-in amplifier while it is approaching and retracting from the substrate in liquid. The normal solvation forces and lateral viscoelastic shear forces experienced by the AFM tip in liquid can be simultaneously measured as a function of the tip-substrate distance with sub-nanometer vertical resolution. A new calibration method is applied to compensate for the linear drift of the piezo transducer and substrate system, leading to a more precise determination of the tip-substrate distance. By monitoring the phase lag between the driving signal and the cantilever response in liquid, the frequency dependent viscoelastic properties of the confined liquid can also be derived. Finally, we discuss the results obtained with this technique from different liquid-solid interfaces. Namely, octamethylcyclotetrasiloxane and water on mica and highly oriented pyrolytic graphite.

UR - http://www.scopus.com/inward/record.url?scp=84919667998&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84919667998&partnerID=8YFLogxK

U2 - 10.1063/1.4903353

DO - 10.1063/1.4903353

M3 - Article

VL - 85

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 12

M1 - 123707

ER -