Nanolayer characterization through wavelength multiplexing of a microsphere resonator

Mayumi Noto, Frank Vollmer, David Keng, Iwao Teraoka, Stephen Arnold

Research output: Contribution to journalArticle

Abstract

We optically characterize nanolayer (<150 nm) formation in situ on a silica microsphere in an aqueous environment by simultaneously following the shifts of whispering-gallery modes at two wavelengths. This approach was inspired by layer perturbation theory, which indicates that these two measurements can be used to determine independently both the thickness and the optical dielectric constant. The theory is verified for extreme cases and used to characterize a biophysically relevant hydrogel nanolayer with an extremely small excess refractive index of 0.0012.

Original languageEnglish (US)
Pages (from-to)510-512
Number of pages3
JournalOptics Letters
Volume30
Issue number5
DOIs
StatePublished - Mar 1 2005

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whispering gallery modes
multiplexing
perturbation theory
resonators
permittivity
refractivity
silicon dioxide
shift
wavelengths

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Nanolayer characterization through wavelength multiplexing of a microsphere resonator. / Noto, Mayumi; Vollmer, Frank; Keng, David; Teraoka, Iwao; Arnold, Stephen.

In: Optics Letters, Vol. 30, No. 5, 01.03.2005, p. 510-512.

Research output: Contribution to journalArticle

Noto, Mayumi ; Vollmer, Frank ; Keng, David ; Teraoka, Iwao ; Arnold, Stephen. / Nanolayer characterization through wavelength multiplexing of a microsphere resonator. In: Optics Letters. 2005 ; Vol. 30, No. 5. pp. 510-512.
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