Multiple-quantum 2D spectroscopy of many-body correlations in GaAs quantum wells

Daniel B. Turner, Katherine W. Stone, Patrick Wen, Dylan H. Arias, Keith A. Nelson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Multiple-quantum two-dimensional Fourier transform optical (2D FTOPT) spectroscopy was developed and conducted on GaAs quantum wells. Spatiotemporal femtosecond pulse shaping was used to control the optical phases and time delays of ultrashort pulses in multiple non-collinear beams so that fully coherent four-wave and higher-order mixing measurements could be conducted without delay stages, multiple interferometers, or any active phase control. Coherences of biexcitons, unbound but correlated exciton pairs, and excitons undergoing rephasing were observed directly.

Original languageEnglish (US)
Title of host publicationUltrafast Phenomena in Semiconductors and Nanostructure Materials XIV
DOIs
StatePublished - May 3 2010
EventUltrafast Phenomena in Semiconductors and Nanostructure Materials XIV - San Francisco, CA, United States
Duration: Jan 24 2010Jan 27 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7600
ISSN (Print)0277-786X

Other

OtherUltrafast Phenomena in Semiconductors and Nanostructure Materials XIV
CountryUnited States
CitySan Francisco, CA
Period1/24/101/27/10

    Fingerprint

Keywords

  • Many-body interactions
  • Multidimensional spectroscopy
  • Pulse shaping
  • Quantum well
  • Ultrafast

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Turner, D. B., Stone, K. W., Wen, P., Arias, D. H., & Nelson, K. A. (2010). Multiple-quantum 2D spectroscopy of many-body correlations in GaAs quantum wells. In Ultrafast Phenomena in Semiconductors and Nanostructure Materials XIV [76001J] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7600). https://doi.org/10.1117/12.843632