Multi-modal response compaction adaptive to x-density variation

S. Mohamed Saeed, Ozgur Sinanoglu

Research output: Contribution to journalArticle

Abstract

Scan architectures with compression support have remedied the test time and data volume problems of today's sizable designs. On-chip compression of responses enables the transmission of a reduced volume signature information to the ATE, delivering test data volume savings, while it engenders the challenge of retaining test quality. In particular, unknown bits (x's) in responses corrupt other response bits upon being compacted altogether, masking their observation, and hence preventing the manifestation of the fault effects they possess. In this work, we propose the design and utilisation of a response compactor that can adapt to the varying density of x's in responses. In the proposed design, fan-out of scan chains to XOR trees within the compactor can be adjusted per pattern/slice so as to minimise the corruption impact of x's. A theoretical framework is developed to guide the cost-effective synthesis of multi-modal compactor that can deliver x-mitigation capabilities in every mode it operates. Adaptiveness of the proposed response compactor enhances the observability of scan cells cost-effectively, where observability enhancements can be tailored in a fault model-dependent or -independent manner, in either way improving test quality and/or test costs.

Original languageEnglish (US)
Pages (from-to)69-77
Number of pages9
JournalIET Computers and Digital Techniques
Volume6
Issue number2
DOIs
StatePublished - Mar 1 2012

Fingerprint

Compaction
Observability
Costs
Fans

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Multi-modal response compaction adaptive to x-density variation. / Mohamed Saeed, S.; Sinanoglu, Ozgur.

In: IET Computers and Digital Techniques, Vol. 6, No. 2, 01.03.2012, p. 69-77.

Research output: Contribution to journalArticle

@article{7e9f35195d4f4363955455773d4d2961,
title = "Multi-modal response compaction adaptive to x-density variation",
abstract = "Scan architectures with compression support have remedied the test time and data volume problems of today's sizable designs. On-chip compression of responses enables the transmission of a reduced volume signature information to the ATE, delivering test data volume savings, while it engenders the challenge of retaining test quality. In particular, unknown bits (x's) in responses corrupt other response bits upon being compacted altogether, masking their observation, and hence preventing the manifestation of the fault effects they possess. In this work, we propose the design and utilisation of a response compactor that can adapt to the varying density of x's in responses. In the proposed design, fan-out of scan chains to XOR trees within the compactor can be adjusted per pattern/slice so as to minimise the corruption impact of x's. A theoretical framework is developed to guide the cost-effective synthesis of multi-modal compactor that can deliver x-mitigation capabilities in every mode it operates. Adaptiveness of the proposed response compactor enhances the observability of scan cells cost-effectively, where observability enhancements can be tailored in a fault model-dependent or -independent manner, in either way improving test quality and/or test costs.",
author = "{Mohamed Saeed}, S. and Ozgur Sinanoglu",
year = "2012",
month = "3",
day = "1",
doi = "10.1049/iet-cdt.2011.0104",
language = "English (US)",
volume = "6",
pages = "69--77",
journal = "IET Computers and Digital Techniques",
issn = "1751-8601",
publisher = "Institution of Engineering and Technology",
number = "2",

}

TY - JOUR

T1 - Multi-modal response compaction adaptive to x-density variation

AU - Mohamed Saeed, S.

AU - Sinanoglu, Ozgur

PY - 2012/3/1

Y1 - 2012/3/1

N2 - Scan architectures with compression support have remedied the test time and data volume problems of today's sizable designs. On-chip compression of responses enables the transmission of a reduced volume signature information to the ATE, delivering test data volume savings, while it engenders the challenge of retaining test quality. In particular, unknown bits (x's) in responses corrupt other response bits upon being compacted altogether, masking their observation, and hence preventing the manifestation of the fault effects they possess. In this work, we propose the design and utilisation of a response compactor that can adapt to the varying density of x's in responses. In the proposed design, fan-out of scan chains to XOR trees within the compactor can be adjusted per pattern/slice so as to minimise the corruption impact of x's. A theoretical framework is developed to guide the cost-effective synthesis of multi-modal compactor that can deliver x-mitigation capabilities in every mode it operates. Adaptiveness of the proposed response compactor enhances the observability of scan cells cost-effectively, where observability enhancements can be tailored in a fault model-dependent or -independent manner, in either way improving test quality and/or test costs.

AB - Scan architectures with compression support have remedied the test time and data volume problems of today's sizable designs. On-chip compression of responses enables the transmission of a reduced volume signature information to the ATE, delivering test data volume savings, while it engenders the challenge of retaining test quality. In particular, unknown bits (x's) in responses corrupt other response bits upon being compacted altogether, masking their observation, and hence preventing the manifestation of the fault effects they possess. In this work, we propose the design and utilisation of a response compactor that can adapt to the varying density of x's in responses. In the proposed design, fan-out of scan chains to XOR trees within the compactor can be adjusted per pattern/slice so as to minimise the corruption impact of x's. A theoretical framework is developed to guide the cost-effective synthesis of multi-modal compactor that can deliver x-mitigation capabilities in every mode it operates. Adaptiveness of the proposed response compactor enhances the observability of scan cells cost-effectively, where observability enhancements can be tailored in a fault model-dependent or -independent manner, in either way improving test quality and/or test costs.

UR - http://www.scopus.com/inward/record.url?scp=84858137314&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84858137314&partnerID=8YFLogxK

U2 - 10.1049/iet-cdt.2011.0104

DO - 10.1049/iet-cdt.2011.0104

M3 - Article

AN - SCOPUS:84858137314

VL - 6

SP - 69

EP - 77

JO - IET Computers and Digital Techniques

JF - IET Computers and Digital Techniques

SN - 1751-8601

IS - 2

ER -