Mueller matrix polarimetry with four photoelastic modulators: Theory and calibration

Oriol Arteaga, John Freudenthal, Baoliang Wang, Bart Kahr

Research output: Contribution to journalArticle

Abstract

A spectroscopic Mueller matrix polarimeter with four photoelastic modulators (PEMs) and no moving parts is introduced. In the 4-PEM polarimeter, all the elements of the Mueller matrix are simultaneously determined from the analysis of the frequencies of the time-dependent intensity of the light beam.

Original languageEnglish (US)
Pages (from-to)6805-6817
Number of pages13
JournalApplied Optics
Volume51
Issue number28
DOIs
StatePublished - Oct 1 2012

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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