Morphological analysis for quality assurance in GEM foils

C. A. Rodriguez, R. M. Gutierrez, A. E. Jaramillo, N. Triana

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Gas Electron Multiplier (GEM) is one of the most popular and powerful technologies for gaseous ionization detectors used in high energy physics, medical physics and other applications. One of the fundamental elements of a GEM are foils with micro perforations; the quality of such perforations is determinant for an optimal performance of the GEM. In this work we study and develop different computational methods (implemented in Java programming language), in order to determine the quality of GEM-foils from high resolution images of the foils. This computational method will provide an automatic and high precision alternative to the present procedures which are very expensive, time taking and imprecise, limiting the development and application of this important technology of detectors. The present method can be extended to other high resolution image analysis useful for nanostructures and microstructures. A preliminary study of the method applied to lower resolution images is also presented.

Original languageEnglish (US)
Title of host publication2015 20th Symposium on Signal Processing, Images and Computer Vision, STSIVA 2015 - Conference Proceedings
EditorsPedro Vizcaya Guarin, Lorena Garcia Posada
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467394611
DOIs
StatePublished - Nov 16 2015
Event20th Symposium on Signal Processing, Images and Computer Vision, STSIVA 2015 - Bogota, Colombia
Duration: Sep 2 2015Sep 4 2015

Publication series

Name2015 20th Symposium on Signal Processing, Images and Computer Vision, STSIVA 2015 - Conference Proceedings

Conference

Conference20th Symposium on Signal Processing, Images and Computer Vision, STSIVA 2015
CountryColombia
CityBogota
Period9/2/159/4/15

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ASJC Scopus subject areas

  • Computer Networks and Communications
  • Signal Processing

Cite this

Rodriguez, C. A., Gutierrez, R. M., Jaramillo, A. E., & Triana, N. (2015). Morphological analysis for quality assurance in GEM foils. In P. V. Guarin, & L. G. Posada (Eds.), 2015 20th Symposium on Signal Processing, Images and Computer Vision, STSIVA 2015 - Conference Proceedings [7330462] (2015 20th Symposium on Signal Processing, Images and Computer Vision, STSIVA 2015 - Conference Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/STSIVA.2015.7330462