Model of perceptual image fidelity

David J. Heeger, Patrick C. Teo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An extension of the authors' work on perceptual image distortion is presented. The extended model accounts for (1) contrast sensitivity as a function of spatial frequency, mean luminance and spatial extent, (2) luminance masking, and (3) contrast masking. In a typical spatial pattern detection experiment, the contrast of a visual stimulus called the target is adjusted until it is just barely detectable. Threshold contrasts of the target are measured over a range of spatial frequencies, mean luminances, and spatial extents. The model consists of three main parts: a retinal component for contrast sensitivity, a cortical component for contrast masking, and a detection mechanism.

Original languageEnglish (US)
Title of host publicationIEEE International Conference on Image Processing
Editors Anon
PublisherIEEE
Pages343-344
Number of pages2
Volume2
StatePublished - 1996
EventProceedings of the 1995 IEEE International Conference on Image Processing. Part 3 (of 3) - Washington, DC, USA
Duration: Oct 23 1995Oct 26 1995

Other

OtherProceedings of the 1995 IEEE International Conference on Image Processing. Part 3 (of 3)
CityWashington, DC, USA
Period10/23/9510/26/95

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ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Heeger, D. J., & Teo, P. C. (1996). Model of perceptual image fidelity. In Anon (Ed.), IEEE International Conference on Image Processing (Vol. 2, pp. 343-344). IEEE.