Modal interactions in resonant microscanners

Mohammed Daqaq, Eihab M. Abdel-Rahman, Ali H. Nayfeh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The fast response of micromirrors and their ability to achieve large scanning angles and low wavelength sensitivity, has made them an appealing substitute for traditional scanning and display technologies. To achieve large rotation angles, while minimizing the voltage requirements, the microscanner is excited at its resonance frequency and then used to steer a light beam along a surface. In this work, we develop a comprehensive model of a torsional microscanner. Based on the eigenvalue problem, we reduce the model to a 2-DOF lumped-mass model that captures the significant dynamics of the microscanner. We use the method of multiple scales to derive an approximate analytical solution of the microscanner response to combined DC and resonant AC voltage excitation. We examined the characteristics of the solution and found that, for a range of DC voltage, a two-to-one internal resonance occurs between the first two modes. Therefore, the energy fed to the first (torsional) mode may be channeled to the second (bending) mode causing an undesirable steady-state response. This phenomenon results in significant degradation in the microscanner performance, therefore, the designer needs to identify it, design around it, or control it.

Original languageEnglish (US)
Title of host publicationProceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Applied Mechanics Division
PublisherAmerican Society of Mechanical Engineers (ASME)
ISBN (Print)0791837904, 9780791837900
DOIs
StatePublished - Jan 1 2006
Event2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Chicago, IL, United States
Duration: Nov 5 2006Nov 10 2006

Other

Other2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006
CountryUnited States
CityChicago, IL
Period11/5/0611/10/06

Fingerprint

Electric potential
Scanning
Display devices
Degradation
Wavelength

ASJC Scopus subject areas

  • Mechanical Engineering

Cite this

Daqaq, M., Abdel-Rahman, E. M., & Nayfeh, A. H. (2006). Modal interactions in resonant microscanners. In Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Applied Mechanics Division American Society of Mechanical Engineers (ASME). https://doi.org/10.1115/IMECE2006-13844

Modal interactions in resonant microscanners. / Daqaq, Mohammed; Abdel-Rahman, Eihab M.; Nayfeh, Ali H.

Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Applied Mechanics Division. American Society of Mechanical Engineers (ASME), 2006.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Daqaq, M, Abdel-Rahman, EM & Nayfeh, AH 2006, Modal interactions in resonant microscanners. in Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Applied Mechanics Division. American Society of Mechanical Engineers (ASME), 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006, Chicago, IL, United States, 11/5/06. https://doi.org/10.1115/IMECE2006-13844
Daqaq M, Abdel-Rahman EM, Nayfeh AH. Modal interactions in resonant microscanners. In Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Applied Mechanics Division. American Society of Mechanical Engineers (ASME). 2006 https://doi.org/10.1115/IMECE2006-13844
Daqaq, Mohammed ; Abdel-Rahman, Eihab M. ; Nayfeh, Ali H. / Modal interactions in resonant microscanners. Proceedings of 2006 ASME International Mechanical Engineering Congress and Exposition, IMECE2006 - Applied Mechanics Division. American Society of Mechanical Engineers (ASME), 2006.
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